Inventor · disambiguated record
Wondon Joo
Also filed as: JOO WONDON
5 granted patents·2 pending applications·1 citations·filing 2020–2023
61Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7
Top patents by PatentIndex Score
7 records- 0177US11823961B2Substrate inspection system and method of manufacturing semiconductor device using substrate inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 21, 2023·1 cites·20 claims
- 0260US12487532B2EUV collector inspection apparatus and inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 2, 2025·0 cites·19 claims
- 0354US2024218561A1Thin-film deposition apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0452US11898912B2Hyperspectral imaging (HSI) apparatus and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 0552US2024105524A1Optical device, die bonding system, and die bonding methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0650US12366444B2Optical assembly for parallelism measurement, optical apparatus including the same, die bonding system and die bonding method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jul 22, 2025·0 cites·20 claims
- 0748US12387963B2Optical assembly for alignment inspection, optical apparatus including the same, die bonding system and die bonding method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →