Inventor · disambiguated record
Wook Kim
Also filed as: KIM WOOK · KIM WOOK RAE
17 granted patents·6 pending applications·19 citations·filing 2003–2024
89Inventor score
Files withSAMSUNG ELECTRONICS CO LTD18AJOU UNIV INDUSTRY-ACADEMIC COOPERATION FOUNDATION1HASHIMOTO KOHEI1KIM WOOK1PARK YOUNG KYU1
Top patents by PatentIndex Score
23 records- 0185US9702826B2Method of inspecting a surface of an object and optical system for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jul 11, 2017·3 cites·18 claims
- 0277US10955360B2Structured illumination-based inspection apparatus and inspection method, and semiconductor device fabrication method including structured illumination-based inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 23, 2021·2 cites·12 claims
- 0375US9903764B2Integrated circuit for estimating power of at least one node using temperature and a system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 27, 2018·3 cites·21 claims
- 0469US9425036B2Light source device and semiconductor manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 23, 2016·2 cites·19 claims
- 0569US9305764B2Plasma light source, inspection apparatus including plasma light source, and method of generating plasma lightPARK YOUNG-KYU·Filed 2015·Granted Apr 5, 2016·2 cites·18 claims
- 0667US9839110B2Plasma light source apparatus and light source system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 5, 2017·1 cites·20 claims
- 0766US9459680B2System on chip and temperature control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Oct 4, 2016·3 cites·31 claims
- 0866US2025244240A1System for nondestructive measurement of a sampleSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0965US10879898B2Power gating circuit for holding data in logic blockSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 29, 2020·1 cites·20 claims
- 1064US2025347618A1Semiconductor measurement apparatusSAMSUNG ELECTRICS CO LTD·Filed 2024·Application pending·0 cites
- 1163US9374883B2Plasma light source apparatus and plasma light generating methodSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jun 21, 2016·2 cites·20 claims
- 1262US10972080B2Clock control in semiconductor systemSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 6, 2021·0 cites·19 claims
- 1359US12215974B2Optical measurement apparatus, measuring method using the same, and method for fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 4, 2025·0 cites·20 claims
- 1457US10659014B2Clock control in semiconductor systemSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted May 19, 2020·0 cites·20 claims
- 1556US11761894B2Silicon-rhodamine fluorescent probe containing hydrophobic group and use thereofAJOU UNIV INDUSTRY—ACADEMIC COOPERATION FOUNDATION·Filed 2020·Granted Sep 19, 2023·0 cites·9 claims
- 1651US12345521B2Optical measurement apparatus, measuring method using the same, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 1, 2025·0 cites·20 claims
- 1751US12314653B2Semiconductor process modeling system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 27, 2025·0 cites·20 claims
- 1843US2023215769A1Method for fabricating a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1942US2004100968A1Multiprotocol label switching device with distributed forward engines and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2003·Application pending·0 cites
- 2041US2013086536A1Method of generating standard cell library for dpl process and methods of producing a dpl mask and circuit pattern using the sameKIM WOOK·Filed 2012·Application pending·0 cites
- 2138US9546772B2Rod lens for lighting apparatus, lighting apparatus including the same and semiconductor manufacturing method using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jan 17, 2017·0 cites·17 claims
- 2237US9983144B2Plasma light source and inspection apparatus including the sameHASHIMOTO KOHEI·Filed 2015·Granted May 29, 2018·0 cites·14 claims
- 2335US2015355441A1Objective lens assembly having catadioptric groupSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →