Inventor · disambiguated record
Wookrae Kim
Also filed as: KIM WOOKRAE
15 granted patents·11 pending applications·13 citations·filing 2014–2025
86Inventor score
Files withSAMSUNG ELECTRONICS CO LTD26
Top patents by PatentIndex Score
26 records- 0194US12347096B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 1, 2025·2 cites·12 claims
- 0291US12002698B2Metrology apparatus and method based on diffraction using oblique illumination and method of manufacturing semiconductor device using the metrology methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 4, 2024·4 cites·16 claims
- 0391US11726046B2Multi-scale spectral imaging apparatuses and methods, and methods of manufacturing semiconductor devices by using the imaging methodsSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 15, 2023·4 cites·15 claims
- 0488US11972960B2Imaging ellipsometry (IE)-based inspection method and method of fabricating semiconductor device by using IE-based inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 30, 2024·3 cites·17 claims
- 0572US12228499B2Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Feb 18, 2025·0 cites·19 claims
- 0672US2025225674A1Semiconductor measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0771US12455228B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 28, 2025·0 cites·12 claims
- 0869US12045009B2Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHMSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 23, 2024·0 cites·11 claims
- 0966US11604136B2Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 14, 2023·0 cites·14 claims
- 1064US11314205B2Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHMSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 26, 2022·0 cites·19 claims
- 1162US2025172452A1Liquid leak detection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1261US2023114817A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1360US2025052667A1Optical measurement apparatus and optical measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1459US2025224328A1Device for measuring semiconductorsSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1558US12405226B2Substrate inspection apparatus and substrate inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 2, 2025·0 cites·20 claims
- 1657US12422245B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 23, 2025·0 cites·14 claims
- 1757US2024272561A1Method of managing semiconductor processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1856US2024288265A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1956US2024418645A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 2055US2025297849A1Semiconductor measurement deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 2153US12222282B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Feb 11, 2025·0 cites·20 claims
- 2252US2025012556A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 2350US11624699B2Measurement system capable of adjusting AOI, AOI spread and azimuth of incident lightSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 11, 2023·0 cites·17 claims
- 2449US10699927B1Inspection apparatus and semiconductor structure-manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 30, 2020·0 cites·20 claims
- 2548US2015308654A1Surface light source using arrayed point light sourcesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 2643US11264256B2Wafer inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 1, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →