Inventor · disambiguated record
Wolfgang Osten
Also filed as: OSTEN WOLFGANG · OSTEN WOLFGANG MAX ADOLF BERNHARD
16 granted patents·1 pending application·287 citations·filing 2006–2017
92Inventor score
Files withUNIV STUTTGART9KOERNER KLAUS3CARL MAHR HOLDING GMBH2HOPP DAVID1OSTEN WOLFGANG MAX ADOLF BERNHARD1
Top patents by PatentIndex Score
17 records- 0195US7787132B2Method and arrangement for a rapid and robust chromatic confocal 3D measurement techniqueSIRONA DENTAL SYSTEMS GMBH·Filed 2007·Granted Aug 31, 2010·186 cites·10 claims
- 0293US9739594B2Robust one-shot interferometerUNIV STUTTGART·Filed 2014·Granted Aug 22, 2017·25 cites·3 claims
- 0391US10066997B2Method and device for generating multispectral or hyperspectral light, for hyperspectral imaging and/or for distance measurement and/or 2D or 3D profile measurement of an object by means of spectrometryUNIV STUTTGART·Filed 2015·Granted Sep 4, 2018·28 cites·17 claims
- 0487US8934104B2Method and arrangement for robust interferometry for detecting a feature of an objectKOERNER KLAUS·Filed 2011·Granted Jan 13, 2015·12 cites·15 claims
- 0584US9383306B2Apparatus and a method for spectroscopic ellipsometry, in particular infrared spectroscopic ellipsometryUNIV STUTTGART·Filed 2015·Granted Jul 5, 2016·5 cites·22 claims
- 0680US10323938B2Method for calibrating a measuring deviceCARL MAHR HOLDING GMBH·Filed 2015·Granted Jun 18, 2019·5 cites·22 claims
- 0775US9175954B2Method and arrangement for short coherence holographyKOERNER KLAUS·Filed 2011·Granted Nov 3, 2015·4 cites·28 claims
- 0869US7876446B2Method and assembly for confocal, chromatic, interferometric and spectroscopic scanning of optical, multi-layer data memoriesUNIV STUTTGART·Filed 2006·Granted Jan 25, 2011·8 cites·24 claims
- 0964US8605289B2Method and apparatus for interferometryKOERNER KLAUS·Filed 2009·Granted Dec 10, 2013·5 cites·16 claims
- 1064US7486394B2Optical measuring headCARL MAHR HOLDING GMBH·Filed 2006·Granted Feb 3, 2009·7 cites·21 claims
- 1160US9068862B2Device and method for optically compensating for the measuring track decentralization in rotation angle sensorsHOPP DAVID·Filed 2010·Granted Jun 30, 2015·2 cites·22 claims
- 1245US10481020B2Optical method and arrangement for measuring residual stresses, in particular in coated objectsUNIV STUTTGART·Filed 2016·Granted Nov 19, 2019·0 cites·16 claims
- 1343US9772275B2Method and apparatus for optical absorption measurementsUNIV STUTTGART·Filed 2015·Granted Sep 26, 2017·0 cites·20 claims
- 1442US11231269B2Arrangement and method for robust single-shot interferometryUNIV STUTTGART·Filed 2017·Granted Jan 25, 2022·0 cites·21 claims
- 1536US10612905B2Interferometer using tilted object waves and comprising a Fizeau interferometer objectiveUNIV STUTTGART·Filed 2016·Granted Apr 7, 2020·0 cites·18 claims
- 1636US2016143539A1Measuring probe, an apparatus and a method for label free attenuated reflection infrared spectroscopyUNIV STUTTGART·Filed 2015·Application pending·0 cites
- 1728US8804123B2Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing methodOSTEN WOLFGANG MAX ADOLF BERNHARD·Filed 2012·Granted Aug 12, 2014·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →