Inventor · disambiguated record
Won-Mo Park
Also filed as: PARK WON-MO
20 granted patents·5 pending applications·230 citations·filing 1993–2024
94Inventor score
Top patents by PatentIndex Score
25 records- 0195US9660011B2Organic light emitting diode display device and manufacturing method thereofSAMSUNG DISPLAY CO LTD·Filed 2015·Granted May 23, 2017·15 cites·13 claims
- 0289US7564135B2Semiconductor device having self-aligned contact and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 21, 2009·19 cites·14 claims
- 0383US5443993AMethod for manufacturing a capacitor for a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Aug 22, 1995·49 cites·10 claims
- 0479US8043925B2Method of forming capacitor of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Oct 25, 2011·7 cites·11 claims
- 0575US11048370B2Display device and method of manufacturing the sameSAMSUNG DISPLAY CO LTD·Filed 2017·Granted Jun 29, 2021·2 cites·29 claims
- 0675US7323746B2Recess gate-type semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 29, 2008·7 cites·16 claims
- 0774US2025098320A1Display device and manufacturing method thereofSAMSUNG DISPLAY CO LTD·Filed 2024·Application pending·0 cites
- 0871US5488007AMethod of manufacture of a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1993·Granted Jan 30, 1996·43 cites·10 claims
- 0967US8058678B2Semiconductor memory device including a cylinder type storage node and a method of fabricating the sameKIM GIL-SUB·Filed 2009·Granted Nov 15, 2011·4 cites·11 claims
- 1060US6498044B1Capacitor having perovskite series dielectric film containing copper and manufacturing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 24, 2002·7 cites·10 claims
- 1159US8883622B2Method of fabricating and semiconductor memory device using the samePARK WON-MO·Filed 2012·Granted Nov 11, 2014·2 cites·20 claims
- 1259US8633565B2Semiconductor device including fuse having form of capacitorSONG HO-JU·Filed 2010·Granted Jan 21, 2014·2 cites·20 claims
- 1359US5502336ASemiconductor device and manufacturing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Mar 26, 1996·23 cites·10 claims
- 1458US5965939ASemiconductor device and a method of manufactureSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Oct 12, 1999·19 cites·9 claims
- 1557US2021217782A1Display device and manufacturing method thereofSAMSUNG DISPLAY CO LTD·Filed 2020·Application pending·0 cites
- 1656US7393742B2Semiconductor device having a capacitor and a fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 1, 2008·1 cites·16 claims
- 1754US5700709AMethod for manufacturing a capacitor for a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 23, 1997·13 cites·8 claims
- 1851US5591670AMethod of manufacturing a semiconductor device having self aligned contact holeSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Jan 7, 1997·15 cites·5 claims
- 1944US9935133B2Display device and manufacturing method thereofSAMSUNG DISPLAY CO LTD·Filed 2016·Granted Apr 3, 2018·0 cites·20 claims
- 2042US9929225B2Display device and a manufacturing method thereofSAMSUNG DISPLAY CO LTD·Filed 2016·Granted Mar 27, 2018·0 cites·16 claims
- 2141US7101769B2Method of forming a reliable high performance capacitor using an isotropic etching processSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 5, 2006·2 cites·15 claims
- 2241US2014141577A1Method of manufacturing thin film transistor array panelSAMSUNG DISPLAY CO LTD·Filed 2013·Application pending·0 cites
- 2341US2006255391A1Method of forming a reliable high performance capacitor using an isotropic etching processSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 2440US8759945B2Fuse structures, e-fuses comprising fuse structures, and semiconductor devices comprising e-fusesKIM SEONG-HO·Filed 2011·Granted Jun 24, 2014·0 cites·20 claims
- 2532US2010187101A1Method of manufacturing the semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →