Inventor · disambiguated record
Wong Soon Wei
Also filed as: WEI WONG SOON
2 granted patents·1 pending application·45 citations·filing 1999–2014
57Inventor score
Top patents by PatentIndex Score
3 records- 0168US6366689B13D profile analysis for surface contour inspectionASTI INC·Filed 1999·Granted Apr 2, 2002·45 cites·8 claims
- 0243US9824432B2Peripheral inspection system and methodMICROVIEW TECH PTE LTD·Filed 2014·Granted Nov 21, 2017·0 cites·20 claims
- 0339US2008013820A1Peripheral inspection system and methodMICROVIEW TECHNOLOGY PTD LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →