Inventor · disambiguated record
Wun-Ye Ku
Also filed as: KU WUN-YE
5 granted patents·3 citations·filing 2020–2024
64Inventor score
Files withNANYA TECHNOLOGY CORP5
Top patents by PatentIndex Score
5 records- 0188US11486899B2Wafer test system and methods thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Nov 1, 2022·3 cites·12 claims
- 0275US12253473B2Electronic system of specimen qualificationNANYA TECHNOLOGY CORP·Filed 2024·Granted Mar 18, 2025·0 cites·6 claims
- 0361US12019032B2Electronic system and method of specimen qualificationNANYA TECHNOLOGY CORP·Filed 2020·Granted Jun 25, 2024·0 cites·13 claims
- 0457US12211200B2Wafer inspection system methodNANYA TECHNOLOGY CORP·Filed 2022·Granted Jan 28, 2025·0 cites·11 claims
- 0555US12148144B2Wafer inspection systemNANYA TECHNOLOGY CORP·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →