Inventor · disambiguated record

Xavier Metais

Also filed as: METAIS XAVIER

2 granted patents·8 citations·filing 2006–2007

53Inventor score

Technology areasH10P

Files withCIT ALCATEL1 FAVRE ARNAUD1

Top patents by PatentIndex Score

2 records

0171US7790479B2Method and device for monitoring the contamination of substrate wafersCIT ALCATEL·Filed 2006·Granted Sep 7, 2010·5 cites·23 claims
0263US8151816B2Method and device for removing pollution from a confined environmentFAVRE ARNAUD·Filed 2007·Granted Apr 10, 2012·3 cites·30 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →