Inventor · disambiguated record
Xiuguo Chen
Also filed as: CHEN XIUGUO
10 granted patents·1 pending application·7 citations·filing 2013–2023
79Inventor score
Files withUNIV HUAZHONG SCIENCE TECH9SHANGHAI WINDROSE AUTOMOTIVE TECH CO LTD1WUHAN EOPTICS TECH CO LTD1
Top patents by PatentIndex Score
11 records- 0184US11619883B2Snapshot type overlay error measuring device and measuring methodUNIV HUAZHONG SCIENCE TECH·Filed 2021·Granted Apr 4, 2023·1 cites·10 claims
- 0282US10739251B2High temporal resolution Mueller matrix elliptical polarization measuring device and methodUNIV HUAZHONG SCIENCE TECH·Filed 2018·Granted Aug 11, 2020·2 cites·10 claims
- 0375US10345568B2Mueller-matrix microscope and measurement and calibration methods using the sameWUHAN EOPTICS TECH CO LTD·Filed 2017·Granted Jul 9, 2019·4 cites·9 claims
- 0462US2025003866A1Method for measuring optical properties and geometric properties of thin film materialUNIV HUAZHONG SCIENCE TECH·Filed 2023·Application pending·0 cites
- 0551US11143804B2Optimization methods of polarization modulator and polarization measurement systemUNIV HUAZHONG SCIENCE TECH·Filed 2018·Granted Oct 12, 2021·0 cites·8 claims
- 0646US11644413B2Method for measuring dielectric tensor of materialUNIV HUAZHONG SCIENCE TECH·Filed 2020·Granted May 9, 2023·0 cites·5 claims
- 0746US10983007B2Material optical transition analysis method and systemUNIV HUAZHONG SCIENCE TECH·Filed 2019·Granted Apr 20, 2021·0 cites·3 claims
- 0844US9103667B2Alignment method for optical axes of composite waveplateUNIV HUAZHONG SCIENCE TECH·Filed 2014·Granted Aug 11, 2015·0 cites·8 claims
- 0941US11662197B2Rapid measurement method for ultra-thin film optical constantUNIV HUAZHONG SCIENCE TECH·Filed 2019·Granted May 30, 2023·0 cites·8 claims
- 1037US9070091B2Method for extracting critical dimension of semiconductor nanostructureUNIV HUAZHONG SCIENCE TECH·Filed 2013·Granted Jun 30, 2015·0 cites·4 claims
- 1125USD1104865SSemi-truck bodySHANGHAI WINDROSE AUTOMOTIVE TECH CO LTD·Filed 2023·Granted Dec 9, 2025·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →