Inventor · disambiguated record
Xiuhai Cui
Also filed as: CUI XIUHAI
2 granted patents·0 citations·filing 2021–2021
22Inventor score
Files withHARBIN INST TECHNOLOGY2
Top patents by PatentIndex Score
2 records- 0153US12352708B2Detection method for the radiation-induced defects of oxide layer in electronic devicesHARBIN INST TECHNOLOGY·Filed 2021·Granted Jul 8, 2025·0 cites·10 claims
- 0246US12153082B2Detection method for sensitive parts of ionization damage in bipolar transistorHARBIN INST TECHNOLOGY·Filed 2021·Granted Nov 26, 2024·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →