Inventor · disambiguated record
Xianhe Feng
Also filed as: FENG XIANHE
2 granted patents·4 citations·filing 2019–2022
45Inventor score
Technology areasG01N
Top patents by PatentIndex Score
2 records- 0183US12099025B2Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detectionTHE 59TH INST OF CHINA ORDNANCE INDUSTRY·Filed 2022·Granted Sep 24, 2024·2 cites·10 claims
- 0274US11846595B2Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpieceTHE 59TH INST OF CHINA ORDNANCE INDUSTRY·Filed 2019·Granted Dec 19, 2023·2 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →