Inventor · disambiguated record
Xin Man
Also filed as: MAN XIN
27 granted patents·4 pending applications·43 citations·filing 2008–2024
93Inventor score
Files withHITACHI HIGH TECH SCIENCE CORP26MAN XIN2LIAONING LITIAN NEW MAT CO LTD1TANAKA KEIICHI1YAMAMOTO YO1
Top patents by PatentIndex Score
31 records- 0191US9347896B2Cross-section processing-and-observation method and cross-section processing-and-observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted May 24, 2016·8 cites·13 claims
- 0289US8803111B2Sample preparation apparatus and sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 12, 2014·9 cites·20 claims
- 0381US8274049B2Sample processing and observing methodTANAKA KEIICHI·Filed 2011·Granted Sep 25, 2012·5 cites·7 claims
- 0479US9966226B2Cross-section processing and observation method and cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted May 8, 2018·2 cites·6 claims
- 0578US9046472B2Crystal analysis apparatus, composite charged particle beam device, and crystal analysis methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jun 2, 2015·2 cites·10 claims
- 0676US9384941B2Charged particle beam apparatus and sample observation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Jul 5, 2016·2 cites·8 claims
- 0775US9934938B2Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage mediumHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Apr 3, 2018·3 cites·6 claims
- 0875US8853629B2Cross-section processing and observation method and cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Oct 7, 2014·2 cites·5 claims
- 0974US9080945B2Cross-section processing and observation method and cross-section processing and observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jul 14, 2015·2 cites·11 claims
- 1072US2025304770A1Antistatic and flame-retardant rutile titanium dioxide-loaded antimony tin oxide (ato)/expanded polystyrene (eps) composite, and preparation method and use thereofLIAONING LITIAN NEW MAT CO LTD·Filed 2024·Application pending·0 cites
- 1171US9202671B2Charged particle beam apparatus and sample processing method using charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Dec 1, 2015·2 cites·6 claims
- 1271US8642980B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Feb 4, 2014·2 cites·6 claims
- 1371US8191168B2Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscopeMAN XIN·Filed 2008·Granted May 29, 2012·3 cites·5 claims
- 1465US9368323B2Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Jun 14, 2016·1 cites·5 claims
- 1559US9470642B2Crystal analysis apparatus, composite charged particle beam device, and crystal analysis methodHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Oct 18, 2016·0 cites·5 claims
- 1658US10096449B2Cross-section processing-and-observation method and cross-section processing-and-observation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Oct 9, 2018·0 cites·17 claims
- 1755US9245713B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Jan 26, 2016·0 cites·9 claims
- 1855US2021293668A1Method for observing biological tissue sampleHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 1952US2025140518A1Machining method and charged particle beam deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 2052US2024379323A1Control method, charged particle beam device, and programHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 2150US11424100B2Charged particle beam irradiation apparatus and control methodHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Aug 23, 2022·0 cites·16 claims
- 2250US9318303B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Apr 19, 2016·0 cites·15 claims
- 2350US9260782B2Sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Feb 16, 2016·0 cites·13 claims
- 2449US10692695B2Cross section processing observation method and charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Jun 23, 2020·0 cites·10 claims
- 2548US9287087B2Sample observation method, sample preparation method, and charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Mar 15, 2016·0 cites·10 claims
- 2646US11335534B2Particle beam irradiation apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted May 17, 2022·0 cites·7 claims
- 2744US11114276B2Apparatus, method, and program for processing and observing cross section, and method of measuring shapeHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Sep 7, 2021·0 cites·11 claims
- 2843US10242842B2Method for cross-section processing and observation and apparatus thereforHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Mar 26, 2019·0 cites·6 claims
- 2943US9214316B2Composite charged particle beam apparatusYAMAMOTO YO·Filed 2012·Granted Dec 15, 2015·0 cites·6 claims
- 3041US11600463B2Cross-section observation device, and control methodHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Mar 7, 2023·0 cites·10 claims
- 3136US8581206B2Focused ion beam system and sample processing method using the sameMAN XIN·Filed 2010·Granted Nov 12, 2013·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →