Inventor · disambiguated record
Yatfei Chan
Also filed as: CHAN YATFEI
1 granted patent·1 pending application·1 citations·filing 2022–2022
16Inventor score
Files withNITTO DENKO CORP2
Top patents by PatentIndex Score
2 records- 0174US12099017B2Inspection system, inspection method, and inspection programNITTO DENKO CORP·Filed 2022·Granted Sep 24, 2024·1 cites·8 claims
- 0236US2022237895A1Class determination system, class determination method, and class determination programNITTO DENKO CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →