Inventor · disambiguated record
Yasunori Goto
Also filed as: GOTO YASUNORI
15 granted patents·7 pending applications·40 citations·filing 2001–2023
88Inventor score
Top patents by PatentIndex Score
22 records- 0189US7394070B2Method and apparatus for inspecting patternsHITACHI HIGH TECH CORP·Filed 2005·Granted Jul 1, 2008·14 cites·14 claims
- 0276US12176181B2Pattern inspecting deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 24, 2024·1 cites·16 claims
- 0375US10720307B2Electron microscope device and inclined hole measurement method using sameHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 21, 2020·2 cites·18 claims
- 0475US9390885B2Superposition measuring apparatus, superposition measuring method, and superposition measuring systemHITACHI HIGH TECH CORP·Filed 2014·Granted Jul 12, 2016·3 cites·12 claims
- 0573US10692693B2System and method for measuring patternsHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 23, 2020·1 cites·15 claims
- 0667US10094658B2Overlay measurement method, device, and display deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 9, 2018·2 cites·19 claims
- 0764US12243711B2Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Mar 4, 2025·0 cites·28 claims
- 0857US9681848B2X-ray diagnostic systemGOTO YASUNORI·Filed 2012·Granted Jun 20, 2017·2 cites·3 claims
- 0956US2024112322A1Semiconductor Observation System and Overlay Measurement MethodHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 1055US11626266B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Apr 11, 2023·0 cites·7 claims
- 1153US6480574B2X-ray diagnostic apparatusTOSHIBA KK·Filed 2002·Granted Nov 12, 2002·13 cites·24 claims
- 1249US6797112B2Plasma treatment apparatus and method of producing semiconductor device using the apparatusHITACHI LTD·Filed 2003·Granted Sep 28, 2004·2 cites·7 claims
- 1346US9536700B2Sample observation deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 3, 2017·0 cites·14 claims
- 1445US2021055098A1Charged Particle Beam System and Overlay Shift Amount Measurement MethodHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 1544US2008102561A1Methods of manufacturing printed circuit board assemblySCHLUMBERGER TECHNOLOGY CORP·Filed 2006·Application pending·0 cites
- 1643US2022230842A1Pattern measurement system and pattern measurement methodHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 1742US2013188775A1X-ray diagnosis deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1839US10996569B2Measurement device, method and display deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 4, 2021·0 cites·14 claims
- 1939US2002129904A1Plasma treatment apparatus and method of producing semiconductor device using the apparatusHITACHI LTD·Filed 2001·Application pending·0 cites
- 2037US9507724B2Memory access processing method and information processing deviceFUJITSU LTD·Filed 2015·Granted Nov 29, 2016·0 cites·12 claims
- 2135US2012207282A1X-ray imaging apparatusGOTO YASUNORI·Filed 2012·Application pending·0 cites
- 2232US8905636B2X-ray diagnostic apparatusMATSUZAKI TAKEO·Filed 2012·Granted Dec 9, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →