Inventor · disambiguated record
Yaw-Lin Hwang
Also filed as: HWANG YAW-LIN
1 granted patent·4 pending applications·30 citations·filing 2000–2002
44Inventor score
Technology areasH10P
Files withMACRONIX INT CO LTD3
Top patents by PatentIndex Score
5 records- 0179US6326220B1Method for determining near-surface doping concentrationMACRONIX INT CO LTD·Filed 2000·Granted Dec 4, 2001·30 cites·21 claims
- 0232US2002197784A1Method for forming a gate dielectric layer by a single wafer processFiled 2002·Application pending·0 cites
- 0332US2003017670A1Method of manufacturing a semiconductor memory device with a gate dielectric stackMACRONIX INT CO LTD·Filed 2001·Application pending·0 cites
- 0430US2002177327A1Method for forming a gate dielectric layer by a single wafer processMACRONIX INT CO LTD·Filed 2001·Application pending·0 cites
- 0528US2003157771A1Method of forming an ultra-thin gate dielectric by soft plasma nitridationFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →