Inventor · disambiguated record
Yasushi Ichizawa
Also filed as: ICHIZAWA YASUSHI
9 granted patents·2 pending applications·36 citations·filing 2010–2020
83Inventor score
Top patents by PatentIndex Score
11 records- 0187US8447012B2Radiation inspection apparatusICHIZAWA YASUSHI·Filed 2010·Granted May 21, 2013·12 cites·17 claims
- 0283US8483355B2Radiation inspection apparatus comprising a gas ejecting unit for supporting and conveying a sheet-like sampleICHIZAWA YASUSHI·Filed 2010·Granted Jul 9, 2013·7 cites·4 claims
- 0382US8829459B2Radiation detection apparatusICHIZAWA YASUSHI·Filed 2010·Granted Sep 9, 2014·9 cites·9 claims
- 0474US8488744B2X-ray measurement apparatusICHIZAWA YASUSHI·Filed 2010·Granted Jul 16, 2013·5 cites·16 claims
- 0573US9170194B2Material property measuring apparatusYOKOGAWA ELECTRIC CORP·Filed 2013·Granted Oct 27, 2015·3 cites·12 claims
- 0653US11867636B2Measurement device and measurement method for measuring a physical quantity of a sheetYOKOGAWA ELECTRIC CORP·Filed 2020·Granted Jan 9, 2024·0 cites·12 claims
- 0747US8804138B2Coating dimension measuring apparatusYOKOGAWA ELECTRIC CORP·Filed 2013·Granted Aug 12, 2014·0 cites·13 claims
- 0842US8823819B2Apparatus for measuring position and shape of pattern formed on sheetICHIZAWA YASUSHI·Filed 2011·Granted Sep 2, 2014·0 cites·4 claims
- 0937US2011273557A1Position measuring systemYOKOGAWA ELECTRIC CORP·Filed 2011·Application pending·0 cites
- 1034US2012218542A1Infrared analysis apparatusICHIZAWA YASUSHI·Filed 2012·Application pending·0 cites
- 1130US8547544B2Multichannel photometric measurement apparatusHORIKOSHI KUMIKO·Filed 2011·Granted Oct 1, 2013·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →