Inventor · disambiguated record
Yasuo Ifuku
Also filed as: IFUKU YASUO
7 granted patents·1 pending application·26 citations·filing 2004–2014
80Inventor score
Files withMATSUMOTO KAZUHIKO3ISOJIMA TATSUSHI2IFUKU YASUO1JAPAN SCIENCE & TECH AGENCY1MITSUBISHI CHEM CORP1
Top patents by PatentIndex Score
8 records- 0181US8502277B2Field-effect transistor, single-electron transistor and sensor using the sameMATSUMOTO KAZUHIKO·Filed 2004·Granted Aug 6, 2013·15 cites·24 claims
- 0279US8183057B2Biomaterial construct, its producing method, biomaterial support, target material purifying method, affinity chromatography container, separation chip, analyzing method and analyzing separator for target material, biomaterial complex, and its support, sensor chip, solid support with biomaterial fixed thereonISOJIMA TATSUSHI·Filed 2005·Granted May 22, 2012·8 cites·40 claims
- 0372US9506892B2Field-effect transistor, single-electron transistor and sensor using the sameJAPAN SCIENCE & TECH AGENCY·Filed 2014·Granted Nov 29, 2016·1 cites·22 claims
- 0466US9297800B2Biomaterial construct, its producing method, biomaterial support, target material purifying method, affinity chromatography container, separation chip, analyzing method and analyzing separator for target material, biomaterial complex, and its support, sensor chip, solid support with biomaterial fixed thereonISOJIMA TATSUSHI·Filed 2011·Granted Mar 29, 2016·1 cites·23 claims
- 0559US8772099B2Method of use of a field-effect transistor, single-electron transistor and sensorMATSUMOTO KAZUHIKO·Filed 2012·Granted Jul 8, 2014·0 cites·4 claims
- 0659US8766326B2Field-effect transistor, single-electron transistor and sensorMATSUMOTO KAZUHIKO·Filed 2012·Granted Jul 1, 2014·0 cites·8 claims
- 0749US8785144B2Electric analysis methodIFUKU YASUO·Filed 2009·Granted Jul 22, 2014·1 cites·14 claims
- 0841US2008063566A1Sensor Unit and Reaction Field Cell Unit and AnalyzerMITSUBISHI CHEM CORP·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →