Inventor · disambiguated record
Yasuhito Iguchi
Also filed as: IGUCHI YASUHITO
5 granted patents·6 citations·filing 2014–2024
67Inventor score
Files withTOKYO SEIMITSU CO LTD5
Top patents by PatentIndex Score
5 records- 0182US9664733B2Probe device for testing electrical characteristics of semiconductor elementTOKYO SEIMITSU CO LTD·Filed 2015·Granted May 30, 2017·3 cites·9 claims
- 0274US9442156B2Alignment support device and alignment support method for probe deviceTOKYO SEIMITSU CO LTD·Filed 2015·Granted Sep 13, 2016·2 cites·14 claims
- 0358US10481177B2Wafer inspection methodTOKYO SEIMITSU CO LTD·Filed 2014·Granted Nov 19, 2019·1 cites·5 claims
- 0456US12282061B2Wafer test system, probe card replacing method, and proberTOKYO SEIMITSU CO LTD·Filed 2024·Granted Apr 22, 2025·0 cites·11 claims
- 0546US9983256B2Probing device for electronic device and probing methodTOKYO SEIMITSU CO LTD·Filed 2014·Granted May 29, 2018·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →