Inventor · disambiguated record
Yasunori Ikeno
Also filed as: IKENO YASUNORI
5 granted patents·7 pending applications·46 citations·filing 2000–2014
78Inventor score
Top patents by PatentIndex Score
12 records- 0184US7102743B2Semiconductor wafer inspection apparatusOLYMPUS CORP·Filed 2004·Granted Sep 5, 2006·26 cites·8 claims
- 0271US7369237B2Substrate processing apparatus and substrate processing systemOLYMPUS CORP·Filed 2005·Granted May 6, 2008·4 cites·16 claims
- 0365US7308329B2Method and apparatus for inspecting semiconductor waferOLYMPUS CORP·Filed 2005·Granted Dec 11, 2007·6 cites·12 claims
- 0464US6466648B1Repetitive call control method, switch using the method, and recording medium storing repetitive call control programFUJITSU LTD·Filed 2000·Granted Oct 15, 2002·8 cites·14 claims
- 0555US8890887B2Synchronized image browsingLETHERS ANN·Filed 2012·Granted Nov 18, 2014·2 cites·14 claims
- 0646US2015130923A1Microscope systemOLYMPUS CORP·Filed 2014·Application pending·0 cites
- 0744US2015135140A1Microscope-image display control method, computer-readable recording medium storing microscope-image display control program, and microscope-image display deviceOLYMPUS CORP·Filed 2014·Application pending·0 cites
- 0837US2013076886A1Automatic Focus and Sample DetectionIKENO YASUNORI·Filed 2012·Application pending·0 cites
- 0937US2013077892A1Scan Order Optimization and Virtual Slide StitchingIKENO YASUNORI·Filed 2012·Application pending·0 cites
- 1036US2013290860A1Workspace interfaces, methods, and systemsLETHERS ANN·Filed 2012·Application pending·0 cites
- 1130US2013259319A1Image scan method, system and computer readable mediumVINJAMURI MURTHY·Filed 2012·Application pending·0 cites
- 1224US2013083026A1Blending Resolution Layers for Fractional Zoom LevelsLETHERS ANN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →