Inventor · disambiguated record
Yasuhiko Ishibashi
Also filed as: ISHIBASHI YASUHIKO
2 granted patents·4 pending applications·7 citations·filing 2010–2013
51Inventor score
Top patents by PatentIndex Score
6 records- 0166US8243880B2Substrate measuring method and apparatusISHIBASHI YASUHIKO·Filed 2010·Granted Aug 14, 2012·5 cites·19 claims
- 0256US8934607B2Measuring apparatus and measuring methodISHIBASHI YASUHIKO·Filed 2012·Granted Jan 13, 2015·2 cites·16 claims
- 0343US2014376694A1Substrate measurement apparatus and substrate measurement methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 0436US2014067316A1Measuring apparatus, detector deviation monitoring method and measuring methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 0535US2011235029A1Pattern measuring method and pattern measuring apparatusKANEKO MAKOTO·Filed 2010·Application pending·0 cites
- 0633US2015012239A1Measurement apparatus and measurement methodTOSHIBA KK·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →