Inventor · disambiguated record
Yasuhiro Isobe
Also filed as: ISOBE YASUHIRO
30 granted patents·23 pending applications·128 citations·filing 2009–2025
94Inventor score
Files withTOSHIBA KK45HORIBA STEC CO LTD4TOSHIBA ELECTRONIC DEVICES & STORAGE CORP2KASHIMA TOSHIHIRO1TAKEUCHI HIROYUKI1
Top patents by PatentIndex Score
53 records- 0195US11264899B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Mar 1, 2022·4 cites·13 claims
- 0292US9223318B2Mass flow controller systemTAKEUCHI HIROYUKI·Filed 2010·Granted Dec 29, 2015·30 cites·4 claims
- 0392US8851105B2Mass flow meter, mass flow controller, mass flow meter system and mass flow control system containing the mass flow meter and the mass flow controllerKASHIMA TOSHIHIRO·Filed 2010·Granted Oct 7, 2014·24 cites·7 claims
- 0492US8356623B2Mass flow meter and mass flow controllerHORIBA STEC CO LTD·Filed 2009·Granted Jan 22, 2013·59 cites·6 claims
- 0591US11508647B2Semiconductor deviceTOSHIBA KK·Filed 2021·Granted Nov 22, 2022·2 cites·20 claims
- 0691US10771057B1Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Sep 8, 2020·3 cites·6 claims
- 0784US12328924B2Semiconductor deviceTOSHIBA KK·Filed 2021·Granted Jun 10, 2025·1 cites·16 claims
- 0884US12027614B2Semiconductor deviceTOSHIBA KK·Filed 2021·Granted Jul 2, 2024·1 cites·13 claims
- 0974US9627489B2Semiconductor deviceTOSHIBA KK·Filed 2015·Granted Apr 18, 2017·2 cites·20 claims
- 1072US12170316B2Nitride semiconductor device with element isolation areaTOSHIBA KK·Filed 2023·Granted Dec 17, 2024·0 cites·20 claims
- 1171US10998433B2Semiconductor deviceTOSHIBA KK·Filed 2019·Granted May 4, 2021·1 cites·9 claims
- 1265US9136346B2High electron mobility transistor (HEMT) capable of absorbing a stored hole more efficientlyTOSHIBA KK·Filed 2013·Granted Sep 15, 2015·1 cites·11 claims
- 1362US2025351414A1Semiconductor deviceTOSHIBA KK·Filed 2025·Application pending·0 cites
- 1461US11830916B2Nitride semiconductor device with element isolation areaTOSHIBA KK·Filed 2021·Granted Nov 28, 2023·0 cites·18 claims
- 1561US2022140731A1Semiconductor deviceTOSHIBA KK·Filed 2022·Application pending·0 cites
- 1658US12444668B2Semiconductor deviceTOSHIBA KK·Filed 2023·Granted Oct 14, 2025·0 cites·7 claims
- 1757US12362264B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Jul 15, 2025·0 cites·10 claims
- 1857US12046668B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Jul 23, 2024·0 cites·12 claims
- 1957US2024322027A1Semiconductor device and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2023·Application pending·0 cites
- 2057US2024321977A1Semiconductor device and method for manufacturingTOSHIBA KK·Filed 2023·Application pending·0 cites
- 2157US2024321974A1Semiconductor device and semiconductor moduleTOSHIBA KK·Filed 2023·Application pending·0 cites
- 2256US11984387B2Plurality of stacked transistors attached by solder ballsTOSHIBA KK·Filed 2022·Granted May 14, 2024·0 cites·10 claims
- 2355US2024105826A1Semiconductor device and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2023·Application pending·0 cites
- 2454US2024088280A1Nitride semiconductor deviceTOSHIBA KK·Filed 2023·Application pending·0 cites
- 2553US2019271083A1Film formation apparatusTOSHIBA ELECTRONIC DEVICES & STORAGE CORP·Filed 2018·Application pending·0 cites
- 2652US11948864B2Semiconductor deviceTOSHIBA KK·Filed 2021·Granted Apr 2, 2024·0 cites·20 claims
- 2751US12062651B2Semiconductor deviceTOSHIBA KK·Filed 2021·Granted Aug 13, 2024·0 cites·16 claims
- 2851US11448535B2Flow rate calculation system, flow rate calculation system program, flow rate calculation method, and flow rate calculation deviceHORIBA STEC CO LTD·Filed 2020·Granted Sep 20, 2022·0 cites·12 claims
- 2950US12273101B2Semiconductor deviceTOSHIBA KK·Filed 2023·Granted Apr 8, 2025·0 cites·19 claims
- 3050US11251298B2Power semiconductor deviceTOSHIBA KK·Filed 2020·Granted Feb 15, 2022·0 cites·11 claims
- 3149US9484429B2High electron mobility transistor (HEMT) capable of absorbing a stored hole more efficiently and method for manufacturing the sameTOSHIBA KK·Filed 2015·Granted Nov 1, 2016·0 cites·4 claims
- 3249US2016365417A1Semiconductor deviceTOSHIBA KK·Filed 2016·Application pending·0 cites
- 3347US12002858B2Semiconductor deviceTOSHIBA KK·Filed 2021·Granted Jun 4, 2024·0 cites·20 claims
- 3446US2021223090A1Method for calculating piping capacity and calibrator for flow rate control instrument or flow rate measuring instrumentHORIBA STEC CO LTD·Filed 2019·Application pending·0 cites
- 3546US2015372124A1Semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 3645US2015263099A1Semiconductor deviceTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3743US11290100B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Mar 29, 2022·0 cites·21 claims
- 3842US11162883B2Fluid characteristics measurement system, program storage medium storing program for fluid characteristics measurement system, and fluid characteristics measurement methodHORIBA STEC CO LTD·Filed 2017·Granted Nov 2, 2021·0 cites·4 claims
- 3941US10074739B2Semiconductor device having electric field near drain electrode alleviatedTOSHIBA KK·Filed 2016·Granted Sep 11, 2018·0 cites·12 claims
- 4041US9543146B2Manufacturing method of semiconductor device that includes forming plural nitride semiconductor layers of identical materialTOSHIBA KK·Filed 2015·Granted Jan 10, 2017·0 cites·20 claims
- 4141US2019272989A1Method and apparatus for manufacturing semiconductor deviceTOSHIBA ELECTRONIC DEVICES & STORAGE CORP·Filed 2018·Application pending·0 cites
- 4240US9887281B2Semiconductor deviceTOSHIBA KK·Filed 2016·Granted Feb 6, 2018·0 cites·19 claims
- 4340US9627504B2Semiconductor deviceTOSHIBA KK·Filed 2015·Granted Apr 18, 2017·0 cites·10 claims
- 4435US2017256637A1Semiconductor deviceTOSHIBA KK·Filed 2016·Application pending·0 cites
- 4534US2017077241A1Semiconductor deviceTOSHIBA KK·Filed 2016·Application pending·0 cites
- 4634US2016211358A1Semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 4734US2017271493A1Semiconductor deviceTOSHIBA KK·Filed 2016·Application pending·0 cites
- 4833US2016211357A1Semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 4933US2016268408A1Semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 5033US2016218067A1Semiconductor device and method of manufacturing the semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →