Inventor · disambiguated record
Yasunori Kurosawa
Also filed as: KUROSAWA YASUNORI
11 granted patents·1 pending application·37 citations·filing 2004–2013
86Inventor score
Top patents by PatentIndex Score
12 records- 0173US7592244B2Semiconductor device and method of manufacturing the sameSEIKO EPSON CORP·Filed 2006·Granted Sep 22, 2009·7 cites·9 claims
- 0267US7183645B2Semiconductor device with external terminal joined to concave portion of wiring layerSEIKO EPSON CORP·Filed 2004·Granted Feb 27, 2007·14 cites·12 claims
- 0362US9139861B2Culture substrate comprising cellulose gel, solid medium using same, and cellulase activity assay method using mediumNAGAKI KAZUNORI·Filed 2011·Granted Sep 22, 2015·2 cites·16 claims
- 0460US7615474B2Method for manufacturing semiconductor device with reduced damage to metal wiring layerSEIKO EPSON CORP·Filed 2007·Granted Nov 10, 2009·2 cites·12 claims
- 0555US7067929B2Semiconductor wafer, semiconductor device, circuit board, electronic instrument, and method for manufacturing semiconductor deviceSEIKO EPSON CORP·Filed 2004·Granted Jun 27, 2006·7 cites·30 claims
- 0651US7981792B2Semiconductor device and method of manufacturing the same, circuit board, and electronic instrumentSEIKO EPSON CORP·Filed 2007·Granted Jul 19, 2011·0 cites·12 claims
- 0749US7218008B2Semiconductor device and method of manufacturing the same, circuit board, and electronic instrumentSEIKO EPSON CORP·Filed 2004·Granted May 15, 2007·3 cites·13 claims
- 0845US6894394B2Semiconductor device, circuit board, electronic apparatus, and method for manufacturing semiconductor deviceSEIKO EPSON CORP·Filed 2004·Granted May 17, 2005·2 cites·20 claims
- 0940US7525193B2Semiconductor device and method of manufacturing the sameSEIKO EPSON CORP·Filed 2005·Granted Apr 28, 2009·0 cites·2 claims
- 1040US7365429B2Semiconductor device and method for manufacturing the sameSEIKO EPSON CORP·Filed 2005·Granted Apr 29, 2008·0 cites·4 claims
- 1140US2015050680A1Measuring Method of Enzyme ActivityJAPAN AGENCY MARINE EARTH SCI·Filed 2013·Application pending·0 cites
- 1235US8143173B2Method for manufacturing semiconductor deviceKUROSAWA YASUNORI·Filed 2007·Granted Mar 27, 2012·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →