Inventor · disambiguated record
Yanbin Luo
Also filed as: LUO YANBIN
4 granted patents·23 pending applications·6 citations·filing 2009–2025
59Inventor score
Top patents by PatentIndex Score
27 records- 0178US10280749B2Method for deformation control of large-span tunnel in chlorite schist stratumCHANGAN UNIV·Filed 2018·Granted May 7, 2019·6 cites·9 claims
- 0270US2025323127A1Integrated circuit structure with deep via bar width tuningINTEL CORP·Filed 2025·Application pending·0 cites
- 0365US2025112120A1Integrated circuit structure with deep via bar width tuningINTEL CORP·Filed 2023·Application pending·0 cites
- 0460US2025311273A1Zero diffusion break for improving transistor densityINTEL CORP·Filed 2024·Application pending·0 cites
- 0557US2025311427A1Deep via backside (dvb) partial recess for capacitance reduction in complementary fet (cfet) transistorsINTEL CORP·Filed 2024·Application pending·0 cites
- 0656US2024368991A1Tunnel constraint anchor cable and method for improving stability of initial support structureCHANGAN UNIV·Filed 2024·Application pending·0 cites
- 0756US2025393250A1Integrated circuit structures having hybrid channel layoutINTEL CORP·Filed 2024·Application pending·0 cites
- 0855US2025311363A1Backside gate cut formationINTEL CORP·Filed 2024·Application pending·0 cites
- 0955US2025311283A1Selective channel width scaling using implantsINTEL CORP·Filed 2024·Application pending·0 cites
- 1054US2025212470A1Integrated circuit device with backside isolaton regionINTEL CORP·Filed 2023·Application pending·0 cites
- 1153US2025169130A1Integrated circuit structures with different nanoribbon thicknessesINTEL CORP·Filed 2023·Application pending·0 cites
- 1253US2025113586A1Nbti reduction and reliability improvement for selective layoutsINTEL CORP·Filed 2023·Application pending·0 cites
- 1353US2025140649A1Integrated circuit devices with backside semiconductor structuresINTEL CORP·Filed 2023·Application pending·0 cites
- 1452US2025113595A1Multiple voltage threshold integrated circuit structure with local layout effect tuningINTEL CORP·Filed 2023·Application pending·0 cites
- 1552US2025107175A1Integrated circuit structures having reduced local layout effectsINTEL CORP·Filed 2023·Application pending·0 cites
- 1651US2025194070A1Integrated circuit structures with transistor gate-channel arrangements for static random-access memoryCHU TAO·Filed 2023·Application pending·0 cites
- 1750US2025006734A1Performance optimization of transistors sharing channel structures of varying widthINTEL CORP·Filed 2023·Application pending·0 cites
- 1850US2024321887A1Integrated circuit device with reduced n-p boundary effectINTEL CORP·Filed 2023·Application pending·0 cites
- 1950US2025203975A1Integrated circuit device with semiconductor structure extending across gate in isolaton regionXU GUOWEI·Filed 2023·Application pending·0 cites
- 2050US2024321859A1Integrated circuit device with performance-enhancing layoutINTEL CORP·Filed 2023·Application pending·0 cites
- 2147US12169668B2Method for parameters of cross sections of single-hole four-lane highway tunnelCHANGAN UNIV·Filed 2022·Granted Dec 17, 2024·0 cites·3 claims
- 2247US2024105718A1Integrated circuit devices with protection liner between doped semiconductor regionsINTEL CORP·Filed 2022·Application pending·0 cites
- 2347US2024088217A1Barrier layer for dielectric recess mitigationINTEL CORP·Filed 2022·Application pending·0 cites
- 2444US2024113118A1Ultra-low voltage transistor cell design using gate cut layoutINTEL CORP·Filed 2022·Application pending·0 cites
- 2541US2021070660A1Economical high-strength quick-hardening grouting material and grouting reinforcement method for soft rock tunnelCHANGAN UNIV·Filed 2019·Application pending·0 cites
- 2639US8174987B2Method and apparatus for implementing output queue-based flow controlDU WENHUA·Filed 2009·Granted May 8, 2012·0 cites·18 claims
- 2726US9791509B2Monitoring microprocessor interface information for a preset service using an address based filterHUAWEI TECH CO LTD·Filed 2015·Granted Oct 17, 2017·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →