Inventor · disambiguated record
Yasuo Nakagawa
Also filed as: HAMADA TOSHIMITSU · NAKAGAWA YASUO
42 granted patents·2,488 citations·filing 1974–1996
99Inventor score
Files withHITACHI LTD25SUMITOMO BAKELITE CO7TEIJIN LTD5MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2CANON DENSHI KK1
Top patents by PatentIndex Score
42 records- 0198US4172938AProcess for producing polyamides with lactam or urea solvent and CaCl2TEIJIN LTD·Filed 1977·Granted Oct 30, 1979·235 cites·11 claims
- 0297US4018735AAnisotropic dopes of aromatic polyamidesTEIJIN LTD·Filed 1975·Granted Apr 19, 1977·121 cites·13 claims
- 0396US4391511ALight exposure device and methodHITACHI LTD·Filed 1981·Granted Jul 5, 1983·153 cites·23 claims
- 0496US4162126ASurface detect test apparatusHITACHI LTD·Filed 1977·Granted Jul 24, 1979·104 cites·3 claims
- 0595US4611292ARobot vision systemHITACHI LTD·Filed 1983·Granted Sep 9, 1986·80 cites·32 claims
- 0693US5051585AApparatus and method of pattern detection based on a scanning transmission electron microscopeHITACHI LTD·Filed 1989·Granted Sep 24, 1991·73 cites·23 claims
- 0793US4343553AShape testing apparatusHITACHI LTD·Filed 1980·Granted Aug 10, 1982·57 cites·6 claims
- 0892US5278012AMethod for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrateHITACHI LTD·Filed 1992·Granted Jan 11, 1994·237 cites·23 claims
- 0992US5151609AMethod of detecting solid shape of object with autofocusing and image detection at each focus levelHITACHI LTD·Filed 1990·Granted Sep 29, 1992·152 cites·31 claims
- 1092US4226539ACylindrical body appearance inspection apparatusHITACHI LTD·Filed 1977·Granted Oct 7, 1980·57 cites·17 claims
- 1191US4575304ARobot system for recognizing three dimensional shapesHITACHI LTD·Filed 1983·Granted Mar 11, 1986·119 cites·18 claims
- 1291US4410278AMethod and apparatus for appearance inspectionHITACHI LTD·Filed 1980·Granted Oct 18, 1983·79 cites·15 claims
- 1389US4791586AMethod of and apparatus for checking geometry of multi-layer patterns for IC structuresHITACHI LTD·Filed 1985·Granted Dec 13, 1988·99 cites·30 claims
- 1489US4472056AShape detecting apparatusHITACHI LTD·Filed 1981·Granted Sep 18, 1984·48 cites·6 claims
- 1588US4772125AApparatus and method for inspecting soldered portionsHITACHI LTD·Filed 1986·Granted Sep 20, 1988·82 cites·6 claims
- 1688US4732939AFlame-retardant olefinic resin compositionsSUMITOMO BAKELITE CO·Filed 1986·Granted Mar 22, 1988·54 cites·19 claims
- 1788US4403294ASurface defect inspection systemHITACHI LTD·Filed 1980·Granted Sep 6, 1983·61 cites·12 claims
- 1887US5059559AMethod of aligning and bonding tab inner leadsHITACHI LTD·Filed 1988·Granted Oct 22, 1991·88 cites·21 claims
- 1987US4075172ANovel aromatic copolyamides prepared from 3,4' diphenylene type diamines, and shaped articles therefromTEIJIN LTD·Filed 1975·Granted Feb 21, 1978·49 cites·15 claims
- 2084US4801639AFlame-retardant olefinic resin compositionSUMITOMO BAKELITE CO·Filed 1987·Granted Jan 31, 1989·31 cites·9 claims
- 2178US4462919AFerromagnetic resin composition containing polymeric surface precoated magnetic rare earth cobalt powdersSUMITOMO BAKELITE CO·Filed 1983·Granted Jul 31, 1984·35 cites·18 claims
- 2277US4654583AMethod and apparatus for detecting defects of printed circuit patternsHITACHI LTD·Filed 1984·Granted Mar 31, 1987·32 cites·22 claims
- 2377US4553844AConfiguration detecting method and systemHITACHI LTD·Filed 1982·Granted Nov 19, 1985·26 cites·11 claims
- 2475US5308663ABiodegradable nonwoven fabric and its molding vesselKANAI JUYO KOGYO KK·Filed 1991·Granted May 3, 1994·36 cites·11 claims
- 2575US4953224APattern defects detection method and apparatusHITACHI LTD·Filed 1988·Granted Aug 28, 1990·55 cites·7 claims
- 2675US4527326APart feeding and assembling systemHITACHI LTD·Filed 1983·Granted Jul 9, 1985·48 cites·5 claims
- 2774US4814615AMethod and apparatus for detecting defect in circuit pattern of a mask for X-ray exposureHITACHI LTD·Filed 1987·Granted Mar 21, 1989·31 cites·15 claims
- 2873US4872187AX-ray tomographic imaging system and methodHITACHI LTD·Filed 1988·Granted Oct 3, 1989·33 cites·14 claims
- 2972US5002996AFlame retardant olefinic resin compositionSUMITOMO BAKELITE CO·Filed 1989·Granted Mar 26, 1991·28 cites·13 claims
- 3072US4245066AWholly aromatic polyamide blend compositionTEIJIN LTD·Filed 1979·Granted Jan 13, 1981·13 cites·11 claims
- 3171US4641527AInspection method and apparatus for joint junction statesHITACHI LTD·Filed 1985·Granted Feb 10, 1987·30 cites·18 claims
- 3271US4309476ACore-in-sheath type aromatic polyamide fiber and process for producing the sameTEIJIN LTD·Filed 1980·Granted Jan 5, 1982·14 cites·7 claims
- 3370US5015097AMethod for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the methodHITACHI LTD·Filed 1989·Granted May 14, 1991·28 cites·18 claims
- 3466US4278779AAromatic polyamide compositionNAKAGAWA YASUO·Filed 1979·Granted Jul 14, 1981·19 cites·12 claims
- 3562US4441875AMold apparatus for forming article under influence of magnetic fieldSUMITOMO BAKELITE CO·Filed 1983·Granted Apr 10, 1984·22 cites·2 claims
- 3655US4491787AFlatness measuring deviceHITACHI LTD·Filed 1981·Granted Jan 1, 1985·12 cites·7 claims
- 3748US5497230ASpectroradiometerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Mar 5, 1996·14 cites·10 claims
- 3841US5930382AWiring pattern inspecting method and system for carrying out the sameHITACHI LTD·Filed 1996·Granted Jul 27, 1999·15 cites·32 claims
- 3941US5479309AMagnetic head having spacer assembly with laminate of magnetic and non-magnetic materialCANON DENSHI KK·Filed 1995·Granted Dec 26, 1995·5 cites·4 claims
- 4032US4008295AThermoplastic resin compositionSUMITOMO BAKELITE CO·Filed 1975·Granted Feb 15, 1977·4 cites·15 claims
- 4131US5739533AThermal radiation detector having a spectral responsivity not dependent on wavelengthMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Apr 14, 1998·7 cites·25 claims
- 4227US3959407AThermoplastic resin compositionSUMITOMO BAKELITE CO·Filed 1974·Granted May 25, 1976·2 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →