Inventor · disambiguated record
Yasuhiko Nakayama
Also filed as: NAKAYAMA YASUHIKO
30 granted patents·1 pending application·970 citations·filing 1977–2006
98Inventor score
Files withHITACHI LTD13CHINON IND INC8MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4RENESAS TECH CORP3FUJITSU HITACHI PLASMA DISPLAY1
Top patents by PatentIndex Score
31 records- 0197US5774222AManufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 1995·Granted Jun 30, 1998·167 cites·38 claims
- 0295US5677755AMethod and apparatus for pattern exposure, mask used therefor, and semiconductor integrated circuit produced by using themHITACHI LTD·Filed 1994·Granted Oct 14, 1997·147 cites·39 claims
- 0393US6404498B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 2000·Granted Jun 11, 2002·38 cites·26 claims
- 0490US6674890B2Defect inspection method and apparatus thereforHITACHI LTD·Filed 2000·Granted Jan 6, 2004·41 cites·10 claims
- 0590US6169282B1Defect inspection method and apparatus thereforHITACHI LTD·Filed 1998·Granted Jan 2, 2001·107 cites·32 claims
- 0690US6091075AAutomatic focus detection method, automatic focus detection apparatus, and inspection apparatusHITACHI LTD·Filed 1998·Granted Jul 18, 2000·99 cites·42 claims
- 0789US6263099B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedHITACHI LTD·Filed 1998·Granted Jul 17, 2001·56 cites·28 claims
- 0886USD302683SImage information reading machine for electronic computerCHINON IND INC·Filed 1987·Granted Aug 8, 1989·36 cites·1 claims
- 0985US7221486B2Method and apparatus for picking up 2D image of an object to be sensedHITACHI LTD·Filed 2002·Granted May 22, 2007·33 cites·17 claims
- 1083US4745509AMagnetic head with improved supporter for perpendicular magnetization recordingMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1982·Granted May 17, 1988·21 cites·11 claims
- 1180US7061600B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedRENESAS TECH CORP·Filed 2002·Granted Jun 13, 2006·11 cites·37 claims
- 1280US4589747AElectronic flash incorporated cameraCHINON IND INC·Filed 1984·Granted May 20, 1986·22 cites·11 claims
- 1379US4672494AMagnetic head for effecting perpendicular magnetic recordingMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1984·Granted Jun 9, 1987·21 cites·10 claims
- 1476US5409538AControlling method of forming thin film, system for said controlling method, exposure method and system for said exposure methodHITACHI LTD·Filed 1993·Granted Apr 25, 1995·26 cites·26 claims
- 1575US5134298ABeam control method and apparatusHITACHI LTD·Filed 1991·Granted Jul 28, 1992·29 cites·16 claims
- 1674US7460220B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedRENESAS TECH CORP·Filed 2006·Granted Dec 2, 2008·2 cites·11 claims
- 1773US5747201AControlling method of forming thin film, system for said controlling method, exposure method and system for said exposure methodHITACHI LTD·Filed 1995·Granted May 5, 1998·28 cites·13 claims
- 1871US7180584B2Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedRENESAS TECH CORP·Filed 2003·Granted Feb 20, 2007·5 cites·25 claims
- 1969USD327905SCombined image copier and printerCHINON IND INC·Filed 1989·Granted Jul 14, 1992·14 cites·1 claims
- 2067USD284768S35mm CameraCHINON IND INC·Filed 1984·Granted Jul 22, 1986·9 cites·1 claims
- 2164USD285208S35 mm CameraCHINON IND INC·Filed 1984·Granted Aug 19, 1986·8 cites·1 claims
- 2258US6507417B1Method and apparatus for picking up 2D image of an object to be sensedHITACHI LTD·Filed 1998·Granted Jan 14, 2003·23 cites·7 claims
- 2357USD306036S35 mm cameraCHINON IND INC·Filed 1987·Granted Feb 13, 1990·7 cites·1 claims
- 2452US6943388B1Sheet-type β-FeSi2 element, and method and device for manufacturing the sameSYSTEM ENGINEERS CO LTD·Filed 2004·Granted Sep 13, 2005·8 cites·8 claims
- 2550USD306037S35 mm cameraCHINON IND INC·Filed 1987·Granted Feb 13, 1990·5 cites·1 claims
- 2637US5324953AReduced-projection exposure system with chromatic aberration correction system including diffractive lens such as holographic lensHITACHI LTD·Filed 1993·Granted Jun 28, 1994·4 cites·3 claims
- 2735US4796134AMagnetic head with improved supporter for perpendicular magnetization recordingMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1987·Granted Jan 3, 1989·2 cites·34 claims
- 2834US2008008940A1Glass mask used for patterning and manufacturing method and apparatus thereforFUJITSU HITACHI PLASMA DISPLAY·Filed 2006·Application pending·0 cites
- 2930US4140374AOverlap photographing device for sound cinecameraCHINON IND INC·Filed 1977·Granted Feb 20, 1979·0 cites·1 claims
- 3028US4619720AMagnetic amorphous alloys comprising Co, Fe, Zr, and NbMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1984·Granted Oct 28, 1986·1 cites·3 claims
- 3127US7235304B2Optical sensorKANKYO SEMI CONDUCTORS·Filed 2004·Granted Jun 26, 2007·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →