Inventor · disambiguated record
Yasumasa Nishimura
Also filed as: NISHIMURA YASUMASA
7 granted patents·4 pending applications·65 citations·filing 1985–2005
83Inventor score
Top patents by PatentIndex Score
11 records- 0167US4672582ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1985·Granted Jun 9, 1987·24 cites·3 claims
- 0258US4692901ASemiconductor memoryMITSUBISHI ELECTRIC CORP·Filed 1985·Granted Sep 8, 1987·16 cites·12 claims
- 0353US2003061083A1Engineer's productivity evaluation methodMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0448US6577150B1Testing apparatus and method of measuring operation timing of semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jun 10, 2003·5 cites·5 claims
- 0538US6768133B2Semiconductor device, test method for semiconductor device, and tester for semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Jul 27, 2004·0 cites·4 claims
- 0638US2005251714A1Test apparatus for semiconductor devices built-in self-test functionRENASAS TECHNOLOGY CORP·Filed 2005·Application pending·0 cites
- 0737US5872389ASemiconductor device having a fuse layerMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 16, 1999·10 cites·8 claims
- 0836US5072270AStacked capacitor type dynamic random access memoryMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Dec 10, 1991·8 cites·21 claims
- 0934US2003014704A1Test apparatus for semiconductor devices having bult-in self-test functionMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1029US2003074613A1Apparatus for testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1127US4719410ARedundancy-secured semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1985·Granted Jan 12, 1988·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →