Inventor · disambiguated record
Yasuyuki Nodera
Also filed as: NODERA YASUYUKI
1 granted patent·1 pending application·0 citations·filing 2011–2019
2Inventor score
Technology areasH01J
Top patents by PatentIndex Score
2 records- 0137US12170184B2Transmission electron microscope and inspection method using transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 17, 2024·0 cites·12 claims
- 0227US2013062519A1Electron microscope, and method for adjustng optical axis of electron microscopeOYAGI TOSHIYUKI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →