Inventor · disambiguated record
Yasushige Ogawa
Also filed as: OGAWA YASUSHIGE
45 granted patents·3 pending applications·615 citations·filing 1992–2014
98Inventor score
Files withFUJITSU LTD40FUJITSU MICROELECTRONICS LTD3OGAWA YASUSHIGE2FUJII KIYONAGA1FUJITSU SEMICONDUCTOR LTD1
Top patents by PatentIndex Score
48 records- 0195US5608670AFlash memory with improved erasability and its circuitryFUJITSU LTD·Filed 1995·Granted Mar 4, 1997·66 cites·8 claims
- 0294US5487036ANonvolatile semiconductor memoryFUJITSU LTD·Filed 1994·Granted Jan 23, 1996·79 cites·9 claims
- 0393US5590074ANonvolatile semiconductor memoryFUJITSU LTD·Filed 1995·Granted Dec 31, 1996·82 cites·7 claims
- 0488US5576637AXOR CMOS logic gateFUJITSU LTD·Filed 1995·Granted Nov 19, 1996·40 cites·1 claims
- 0583US8542051B2Level shift circuit and semiconductor deviceOGAWA YASUSHIGE·Filed 2011·Granted Sep 24, 2013·7 cites·16 claims
- 0682US7221131B2Control circuit for DC-DC converter in semiconductor integrated circuit deviceFUJITSU LTD·Filed 2005·Granted May 22, 2007·18 cites·20 claims
- 0777US8174282B2Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing methodFUJII KIYONAGA·Filed 2009·Granted May 8, 2012·13 cites·19 claims
- 0876US8659346B2Body-bias voltage controller and method of controlling body-bias voltageOGAWA YASUSHIGE·Filed 2010·Granted Feb 25, 2014·5 cites·11 claims
- 0976US5770963AFlash memory with improved erasability and its circuitryFUJITSU LTD·Filed 1995·Granted Jun 23, 1998·19 cites·2 claims
- 1075US5592419AFlash memory with improved erasability and its circuitryFUJITSU LTD·Filed 1995·Granted Jan 7, 1997·23 cites·1 claims
- 1173US5490107ANonvolatile semiconductor memoryFUJITSU LTD·Filed 1992·Granted Feb 6, 1996·22 cites·44 claims
- 1272US6943616B2Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit deviceFUJITSU LTD·Filed 2003·Granted Sep 13, 2005·14 cites·20 claims
- 1372US5910916AFlash-erasable semiconductor memory device having improved reliabilityFUJITSU LTD·Filed 1997·Granted Jun 8, 1999·21 cites·7 claims
- 1471US7222320B2Layout method of decoupling capacitorsFUJITSU LTD·Filed 2004·Granted May 22, 2007·17 cites·13 claims
- 1571US5519652ANonvolatile semiconductor memory for positively holding stored dataFUJITSU LTD·Filed 1993·Granted May 21, 1996·31 cites·18 claims
- 1669US7353469B2Method and program for designing semiconductor deviceFUJITSU LTD·Filed 2005·Granted Apr 1, 2008·4 cites·14 claims
- 1767US7759976B2Level shift circuitFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Jul 20, 2010·5 cites·20 claims
- 1866US6809605B2Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuitFUJITSU LTD·Filed 2002·Granted Oct 26, 2004·6 cites·18 claims
- 1966US6307801B1Trimming circuit for system integrated circuitFUJITSU LTD·Filed 1999·Granted Oct 23, 2001·24 cites·21 claims
- 2066US6269033B1Semiconductor memory device having redundancy unit for data line compensationFUJITSU LTD·Filed 2000·Granted Jul 31, 2001·15 cites·13 claims
- 2164US7557587B2Control apparatus, semiconductor integrated circuit apparatus, and source voltage supply control systemFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Jul 7, 2009·3 cites·24 claims
- 2264US6275431B1Semiconductor memory device having bit line precharge circuits activated by separate control signals and control method for the sameFUJITSU LTD·Filed 2000·Granted Aug 14, 2001·14 cites·9 claims
- 2362US6014329AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Jan 11, 2000·14 cites·12 claims
- 2462US5761127AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1992·Granted Jun 2, 1998·14 cites·7 claims
- 2561US6891393B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2003·Granted May 10, 2005·7 cites·5 claims
- 2661US5631597ANegative voltage circuit for a flash memoryFUJITSU LTD·Filed 1995·Granted May 20, 1997·10 cites·5 claims
- 2755US7239210B2Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuitFUJITSU LTD·Filed 2006·Granted Jul 3, 2007·1 cites·7 claims
- 2853US6314033B1Semiconductor memory device with redundancy circuitFUJITSU LTD·Filed 2001·Granted Nov 6, 2001·8 cites·11 claims
- 2952US6542421B2Semiconductor memory device with redundancy circuitFUJITSU LTD·Filed 2001·Granted Apr 1, 2003·7 cites·15 claims
- 3050US5835408AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Nov 10, 1998·8 cites·3 claims
- 3149US7459960B2Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit deviceFUJITSU LTD·Filed 2006·Granted Dec 2, 2008·1 cites·9 claims
- 3248US2007001652A1Multi-power supply circuit and multi-power supply methodFUJITSU LTD·Filed 2006·Application pending·0 cites
- 3346US9680465B2Switching circuitSPANSION LLC·Filed 2014·Granted Jun 13, 2017·0 cites·20 claims
- 3446US7167042B2Semiconductor device having logic circuit and macro circuitFUJITSU LTD·Filed 2004·Granted Jan 23, 2007·3 cites·5 claims
- 3545US6741518B2Semiconductor integrated circuit device and data writing method thereforFUJITSU LTD·Filed 2001·Granted May 25, 2004·4 cites·20 claims
- 3645US2010052727A1Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2009·Application pending·0 cites
- 3744US7663392B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Feb 16, 2010·0 cites·2 claims
- 3843US7492232B2Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuitFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Feb 17, 2009·0 cites·14 claims
- 3940US7078945B2Semiconductor device having logic circuit and macro circuitFUJITSU LTD·Filed 2005·Granted Jul 18, 2006·0 cites·1 claims
- 4040US2005270871A1Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit deviceFUJITSU LTD·Filed 2005·Application pending·0 cites
- 4139US6545940B2Semiconductor integrated circuit having enhanced acquisition of external signalFUJITSU LTD·Filed 2001·Granted Apr 8, 2003·2 cites·20 claims
- 4237US7042300B2Oscillator circuit, semiconductor device and semiconductor memory device provided with the oscillator circuit, and control method of the oscillator circuitFUJITSU LTD·Filed 2004·Granted May 9, 2006·0 cites·3 claims
- 4336US7378863B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2004·Granted May 27, 2008·0 cites·2 claims
- 4436US5572463ANonvolatile semiconductor memory with pre-read meansFUJITSU LTD·Filed 1995·Granted Nov 5, 1996·5 cites·12 claims
- 4535US6700437B1Semiconductor device including logic circuit and macro circuit which has a function for stopping a direct currentFUJITSU LTD·Filed 2000·Granted Mar 2, 2004·0 cites·19 claims
- 4635US5870337AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Feb 9, 1999·2 cites·2 claims
- 4732US6525975B2Semiconductor integrated circuit device and data-write method thereofFUJITSU LTD·Filed 2001·Granted Feb 25, 2003·0 cites·14 claims
- 4832US5835416AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Nov 10, 1998·1 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →