Inventor · disambiguated record
Yaoming Shi
Also filed as: SHI YAOMING
2 granted patents·2 pending applications·38 citations·filing 2007–2024
56Inventor score
Files withSHANGHAI UNITED IMAGING HEALTHCARE CO LTD2HENCH JOHN1RAINTREE SCIENTIFIC INSTR SHANGHAI CORP1
Top patents by PatentIndex Score
4 records- 0191US8798966B1Measuring critical dimensions of a semiconductor structureHENCH JOHN·Filed 2007·Granted Aug 5, 2014·38 cites·35 claims
- 0275US2025014738A1Control systems and methodsSHANGHAI UNITED IMAGING HEALTHCARE CO LTD·Filed 2024·Application pending·0 cites
- 0363US12100506B2Control systems and methodsSHANGHAI UNITED IMAGING HEALTHCARE CO LTD·Filed 2020·Granted Sep 24, 2024·0 cites·12 claims
- 0421US2015198434A1Method and apparatus for measuring critical dimension of semiconductorRAINTREE SCIENTIFIC INSTR SHANGHAI CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →