Inventor · disambiguated record
Yasuhiro Shirasaki
Also filed as: SHIRASAKI YASUHIRO
18 granted patents·4 pending applications·29 citations·filing 2004–2022
88Inventor score
Top patents by PatentIndex Score
22 records- 0189US11355308B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 7, 2022·2 cites·13 claims
- 0284US11177108B2Charged particle beam application apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·4 cites·15 claims
- 0380US11328897B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted May 10, 2022·1 cites·17 claims
- 0471US8515066B2Method, apparatus and program for establishing encrypted communication channel between apparatusesSAITO MAKOTO·Filed 2004·Granted Aug 20, 2013·21 cites·16 claims
- 0570US11631568B2Device defect detection method using a charged particle beamHITACHI HIGH TECH CORP·Filed 2021·Granted Apr 18, 2023·0 cites·16 claims
- 0666US10755396B2Image forming apparatusHITACHI LTD·Filed 2018·Granted Aug 25, 2020·1 cites·12 claims
- 0758US12125667B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 22, 2024·0 cites·10 claims
- 0858US11915903B2Electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Feb 27, 2024·0 cites·14 claims
- 0953US12196802B2Semiconductor inspection device and method for inspecting semiconductor sampleHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·19 claims
- 1051US10361063B2Charged particle detector and charged particle beam device using the sameHITACHI LTD·Filed 2018·Granted Jul 23, 2019·0 cites·14 claims
- 1149US2024177964A1Charged Particle Beam SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1248US12406826B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 2, 2025·0 cites·15 claims
- 1347US10256068B2Charged particle beam apparatusHITACHI LTD·Filed 2017·Granted Apr 9, 2019·0 cites·14 claims
- 1445US11334761B2Information processing system and information processing methodHITACHI LTD·Filed 2019·Granted May 17, 2022·0 cites·15 claims
- 1545US10483083B2Scanning electron microscope and image processing apparatusHITACHI LTD·Filed 2018·Granted Nov 19, 2019·0 cites·15 claims
- 1644US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
- 1743US2025232946A1Charged particle beam device, and measurement methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1843US2020225175A1Analyzing systemHITACHI LTD·Filed 2018·Application pending·0 cites
- 1942US10651004B2Charged particle beam deviceHITACHI LTD·Filed 2016·Granted May 12, 2020·0 cites·14 claims
- 2042US2025046569A1Inspection device and film quality inspection methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2136US9991088B2Charged particle beam device and aberration correctorHITACHI LTD·Filed 2015·Granted Jun 5, 2018·0 cites·12 claims
- 2231US9935240B2Near-infrared light emitting device using semiconductor nanocrystalsSUPRAN GEOFFREY J S·Filed 2013·Granted Apr 3, 2018·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →