Inventor · disambiguated record
Yasuhiro Someda
Also filed as: SOMEDA YASUHIRO
31 granted patents·2 pending applications·264 citations·filing 1994–2019
97Inventor score
Top patents by PatentIndex Score
33 records- 0194US7378668B2Method and apparatus for applying charged particle beamHITACHI HIGH TECH CORP·Filed 2006·Granted May 27, 2008·25 cites·11 claims
- 0291US7408760B2Charged particle beam application systemHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 5, 2008·21 cites·12 claims
- 0389US7425714B2Measurement method of electron beam current, electron beam writing system and electron beam detectorHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 16, 2008·12 cites·12 claims
- 0486US6121625ACharged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 1998·Granted Sep 19, 2000·30 cites·11 claims
- 0584US9693753B2Ultrasonic probe, and photoacoustic-ultrasonic system and inspection object imaging apparatus including the ultrasonic probeCANON KK·Filed 2015·Granted Jul 4, 2017·4 cites·16 claims
- 0683US6730916B1Electron beam lithography apparatusCANON KK·Filed 2000·Granted May 4, 2004·28 cites·43 claims
- 0781US11357407B2Photoacoustic apparatusCANON KK·Filed 2019·Granted Jun 14, 2022·2 cites·14 claims
- 0875US6441383B1Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2001·Granted Aug 27, 2002·6 cites·1 claims
- 0975US6262428B1Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2000·Granted Jul 17, 2001·6 cites·3 claims
- 1073US10561396B2Ultrasonic probe, and photoacoustic-ultrasonic system and inspection object imaging apparatus including the ultrasonic probeCANON KK·Filed 2017·Granted Feb 18, 2020·1 cites·48 claims
- 1173US5396077AElectron beam lithography apparatus having electron optics correction systemHITACHI LTD·Filed 1994·Granted Mar 7, 1995·24 cites·5 claims
- 1272US8997571B2Ultrasonic probe, and photoacoustic-ultrasonic system and inspection object imaging apparatus including the ultrasonic probeSOMEDA YASUHIRO·Filed 2009·Granted Apr 7, 2015·7 cites·20 claims
- 1371US7341393B2Mechanism for sealingCANON KK·Filed 2005·Granted Mar 11, 2008·3 cites·12 claims
- 1470US6320198B1Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2000·Granted Nov 20, 2001·4 cites·1 claims
- 1569US5650631AElectron beam writing systemHITACHI LTD·Filed 1995·Granted Jul 22, 1997·22 cites·30 claims
- 1668US10413193B2Photoacoustic apparatusCANON KK·Filed 2015·Granted Sep 17, 2019·1 cites·31 claims
- 1767US8396534B2Intravital-information imaging apparatusFUKUTANI KAZUHIKO·Filed 2008·Granted Mar 12, 2013·5 cites·6 claims
- 1867US6511048B1Electron beam lithography apparatus and pattern forming methodHITACHI LTD·Filed 1998·Granted Jan 28, 2003·20 cites·15 claims
- 1966US8998814B2Diagnostic ultrasound apparatusOIKAWA KATSUYA·Filed 2009·Granted Apr 7, 2015·4 cites·14 claims
- 2065US9439267B2Analyte-information acquisition apparatusTOKITA TOSHINOBU·Filed 2012·Granted Sep 6, 2016·2 cites·9 claims
- 2165US9226662B2Photoacoustic apparatusSOMEDA YASUHIRO·Filed 2010·Granted Jan 5, 2016·2 cites·19 claims
- 2265US8747318B2Ultrasonic measurement apparatusSHIINA TSUYOSHI·Filed 2009·Granted Jun 10, 2014·7 cites·13 claims
- 2363US5831273ACharged particle beam lithography method and apparatus thereofHITACHI LTD·Filed 1997·Granted Nov 3, 1998·16 cites·18 claims
- 2461US10455664B2Analyte-information acquisition apparatusCANON KK·Filed 2016·Granted Oct 22, 2019·0 cites·15 claims
- 2556US6555833B2Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2002·Granted Apr 29, 2003·1 cites·2 claims
- 2651US9689974B2Image forming method using ultrasound and aberration correction methodSOMEDA YASUHIRO·Filed 2009·Granted Jun 27, 2017·2 cites·15 claims
- 2750US5759423AElectron beam writing method and apparatus for carrying out the sameHITACHI LTD·Filed 1995·Granted Jun 2, 1998·9 cites·48 claims
- 2848US2015173713A1Diagnostic ultrasound apparatusCANON KK·Filed 2015·Application pending·0 cites
- 2946US6583431B2Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2002·Granted Jun 24, 2003·0 cites·1 claims
- 3046US6509572B2Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2002·Granted Jan 21, 2003·0 cites·1 claims
- 3144US6329665B1Charged particle beam lithography apparatus for forming pattern on semi-conductorHITACHI LTD·Filed 2000·Granted Dec 11, 2001·0 cites·1 claims
- 3242US9271695B2Apparatus for mammography with acoustic matchingTOKITA TOSHINOBU·Filed 2011·Granted Mar 1, 2016·0 cites·13 claims
- 3338US2006011869A1Measurement method of electron beam current, electron beam lithography method and systemTANAKA NORIYUKI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →