Inventor · disambiguated record
Yasuhiro Suematsu
Also filed as: SUEMATSU YASUHIRO
18 granted patents·2 pending applications·79 citations·filing 1997–2021
92Inventor score
Top patents by PatentIndex Score
20 records- 0192US10360982B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Jul 23, 2019·9 cites·18 claims
- 0285US10586599B1Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 10, 2020·7 cites·13 claims
- 0382US7576523B2Power supply circuit and semiconductor memoryTOSHIBA KK·Filed 2008·Granted Aug 18, 2009·15 cites·16 claims
- 0475US11004521B2Semiconductor device and semiconductor memory deviceKIOXIA CORP·Filed 2020·Granted May 11, 2021·1 cites·16 claims
- 0575US6519198B2Semiconductor memory deviceTOSHIBA KK·Filed 2001·Granted Feb 11, 2003·20 cites·14 claims
- 0668US9401324B2Semiconductor device having an on die termination circuitTOSHIBA KK·Filed 2013·Granted Jul 26, 2016·2 cites·19 claims
- 0767US8242812B2Buffer circuitKOYANAGI MASARU·Filed 2010·Granted Aug 14, 2012·3 cites·20 claims
- 0861US8861287B2Interface circuitSHIMIZU YUUI·Filed 2012·Granted Oct 14, 2014·2 cites·22 claims
- 0953US8405432B2Output buffer circuit, input buffer circuit, and input/output buffer circuitKOYANAGI MASARU·Filed 2010·Granted Mar 26, 2013·1 cites·22 claims
- 1049US11728642B2Semiconductor device and protection circuitKIOXIA CORP·Filed 2021·Granted Aug 15, 2023·0 cites·20 claims
- 1148US7173479B2Semiconductor integrated circuit deviceTOSHIBA KK·Filed 2004·Granted Feb 6, 2007·6 cites·14 claims
- 1245US12243869B2Semiconductor device and semiconductor storage deviceKIOXIA CORP·Filed 2021·Granted Mar 4, 2025·0 cites·13 claims
- 1342US6999356B2Semiconductor device capable of readjusting a reference potential during the reliabilty testTOSHIBA KK·Filed 2004·Granted Feb 14, 2006·4 cites·18 claims
- 1442US2013228867A1Semiconductor device protected from electrostatic dischargeTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1541US7772814B2Step-down circuitTOSHIBA KK·Filed 2008·Granted Aug 10, 2010·0 cites·17 claims
- 1640US6046955ASemiconductor memory device with testable spare columns and rowsTOSHIBA KK·Filed 1999·Granted Apr 4, 2000·7 cites·14 claims
- 1738US2014285231A1Semiconductor device and trimming method for the sameTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1837US9218859B2Semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Dec 22, 2015·0 cites·16 claims
- 1935US10121778B2Semiconductor deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Nov 6, 2018·0 cites·20 claims
- 2030US5914899ASemiconductor memory having a page mode in which previous data in an output circuit is reset before new data is suppliedTOSHIBA KK·Filed 1997·Granted Jun 22, 1999·2 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →