Inventor · disambiguated record
Yasuhiro Takahama
Also filed as: TAKAHAMA YASUHIRO
8 granted patents·1 pending application·17 citations·filing 2008–2020
80Inventor score
Top patents by PatentIndex Score
9 records- 0177US9341460B2Double cone stylus, touch probe, and method of calibrating double cone stylusMITUTOYO CORP·Filed 2013·Granted May 17, 2016·4 cites·6 claims
- 0276US8416426B2Calibrating jig, profile measuring device, and method of offset calculationYAMAGATA MASAOKI·Filed 2012·Granted Apr 9, 2013·4 cites·3 claims
- 0372US10274313B2Measurement method and measurement program for calculating roughness of a curved surfaceMITUTOYO CORP·Filed 2017·Granted Apr 30, 2019·2 cites·7 claims
- 0465US8139229B2Calibrating jig, profile measuring device, and method of offset calculationYAMAGATA MASAOKI·Filed 2009·Granted Mar 20, 2012·4 cites·9 claims
- 0559US7882723B2Abnormality detecting method for form measuring mechanism and form measuring mechanismMITUTOYO CORP·Filed 2008·Granted Feb 8, 2011·3 cites·16 claims
- 0653US12352558B2Shape reconstruction method and image measurement deviceMACHINE VISION LIGHTING INC·Filed 2020·Granted Jul 8, 2025·0 cites·15 claims
- 0750US10551174B2Calibration method of image measuring deviceMITUTOYO CORP·Filed 2018·Granted Feb 4, 2020·0 cites·4 claims
- 0846US10578414B2Inner-wall measuring instrument and offset-amount calculation methodMITUTOYO CORP·Filed 2017·Granted Mar 3, 2020·0 cites·18 claims
- 0943US2019220185A1Image measurement apparatus and computer readable mediumMITUTOYO CORP·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →