Inventor · disambiguated record
Yasuhiko Takahshi
Also filed as: TAKAHSHI YASUHIKO
6 granted patents·49 citations·filing 2003–2011
84Inventor score
Technology areasH10D
Top patents by PatentIndex Score
6 records- 0192US8476138B2Semiconductor memory device and a method of manufacturing the same, a method of manufacturing a vertical MISFET and a vertical MISFET, and a method of manufacturing a semiconductor device and a semiconductor deviceCHAKIHARA HIRAKU·Filed 2011·Granted Jul 2, 2013·12 cites·7 claims
- 0288US7972920B2Semiconductor memory device and a method of manufacturing the same, a method of manufacturing a vertical MISFET and a vertical MISFET, and a method of manufacturing a semiconductor device and a semiconductor deviceHITACHI ULSI SYS CO LTD·Filed 2010·Granted Jul 5, 2011·7 cites·12 claims
- 0381US7701020B2Semiconductor memory device and a method of manufacturing the same, a method of manufacturing a vertical MISFET and a vertical MISFET, and a method of manufacturing a semiconductor device and a semiconductor deviceRENESAS TECH CORP·Filed 2009·Granted Apr 20, 2010·5 cites·7 claims
- 0481US7190031B2Semiconductor memory device and a method of manufacturing the same, a method of manufacturing a vertical MISFET and a vertical MISFET, and a method of manufacturing a semiconductor device and a semiconductor deviceHITACHI ULSI SYS CO LTD·Filed 2003·Granted Mar 13, 2007·18 cites·71 claims
- 0577US7495289B2Semiconductor memory device and a method of manufacturing the same, a method of manufacturing a vertical MISFET and a vertical MISFET, and a method of manufacturing a semiconductor device and a semiconductor deviceRENESAS TECH CORP·Filed 2006·Granted Feb 24, 2009·4 cites·10 claims
- 0673US7161215B2Semiconductor memory device and method of manufacturing the same, a method of manufacturing a vertical MISFET and a vertical MISFET, and a method of manufacturing a semiconductor device and a semiconductor deviceHITACHI ULSI SYS CO LTD·Filed 2006·Granted Jan 9, 2007·3 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →