Inventor · disambiguated record
Yasuhiro Takemura
Also filed as: TAKEMURA YASUHIKO · TAKEMURA YASUHIRO
11 granted patents·1 pending application·479 citations·filing 1990–2015
93Inventor score
Files withSUMITOMO OSAKA CEMENT CO LTD4SUMITOMO CEMENT COMPANY LTD2IDEAQUEST INC1SEIKO INSTR INC1SEMICONDUCTOR ENERGY LAB1
Top patents by PatentIndex Score
12 records- 0189US5216541AOptical associative identifier with real time joint transform correlatorSUMITOMO CEMENT COMPANY LTD·Filed 1990·Granted Jun 1, 1993·115 cites·6 claims
- 0287US7428468B2Monitoring apparatusSUMITOMO OSAKA CEMENT CO LTD·Filed 2002·Granted Sep 23, 2008·76 cites·48 claims
- 0382US7045819B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted May 16, 2006·15 cites·43 claims
- 0478US5619596AMethod and apparatus for optical pattern recognitionSEIKO INSTR INC·Filed 1993·Granted Apr 8, 1997·90 cites·13 claims
- 0574US7431700B2Body movement and respiration monitorUNIV KEIO·Filed 2001·Granted Oct 7, 2008·90 cites·22 claims
- 0672US7651470B2Swallowing function evaluating apparatusSUMITOMO OSAKA CEMENT CO LTD·Filed 2007·Granted Jan 26, 2010·2 cites·15 claims
- 0772US7630537B2Three-dimensional shape-measuring deviceSUMITOMO OSAKA CEMENT CO LTD·Filed 2004·Granted Dec 8, 2009·18 cites·13 claims
- 0852US7545279B2Condition-analyzing deviceSUMITOMO OSAKA CEMENT CO LTD·Filed 2004·Granted Jun 9, 2009·9 cites·8 claims
- 0951US5239595AOptical method for identifying or recognizing a pattern to be identifiedSUMITOMO CEMENT COMPANY LTD·Filed 1990·Granted Aug 24, 1993·29 cites·6 claims
- 1046US5374989AApparatus for identifying an object utilizing a tracking means and an identification beamSUMITOMO CEMENT CO·Filed 1993·Granted Dec 20, 1994·13 cites·16 claims
- 1136US5754693AMethod of optical recognition and classification of patternsSUMITOMO OSAKA CEMENT COMPANY·Filed 1995·Granted May 19, 1998·22 cites·20 claims
- 1225US2016345867A1Respiratory movement measuring deviceIDEAQUEST INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →