Inventor · disambiguated record

Yasuhiko Tandou

Also filed as: TANDOU YASUHIKO

1 granted patent·4 citations·filing 2010–2010

25Inventor score

Technology areasG01R

Files withWATANABE YUICHI1

Top patents by PatentIndex Score

1 record

0172US8736295B2Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing methodWATANABE YUICHI·Filed 2010·Granted May 27, 2014·4 cites·9 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →