Inventor · disambiguated record
Yasushi Terui
Also filed as: TERUI YASUSHI
33 granted patents·5 pending applications·257 citations·filing 1996–2022
96Inventor score
Top patents by PatentIndex Score
38 records- 0195US7473892B2Mass spectrometer systemHITACHI HIGH TECH CORP·Filed 2004·Granted Jan 6, 2009·72 cites·29 claims
- 0291US7595484B2Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric programHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 29, 2009·16 cites·18 claims
- 0387US7186973B2Ion trap/time-of-flight mass analyzing apparatus and mass analyzing methodHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 6, 2007·11 cites·10 claims
- 0487US7064319B2Mass spectrometerAPPLERA CORP·Filed 2003·Granted Jun 20, 2006·27 cites·11 claims
- 0586US8797522B2Light quantity detection method and device thereforNAMBA AKIHIRO·Filed 2011·Granted Aug 5, 2014·10 cites·12 claims
- 0686US6541769B1Mass spectrometerHITACHI LTD·Filed 2000·Granted Apr 1, 2003·25 cites·17 claims
- 0785US7932486B2Mass spectrometer systemHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 26, 2011·7 cites·6 claims
- 0884US7476850B2Method and its apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 13, 2009·9 cites·21 claims
- 0980US6586730B1Plasma ion source mass spectrometerHITACHI LTD·Filed 2000·Granted Jul 1, 2003·17 cites·1 claims
- 1074US7928365B2Method and apparatus for mass spectrometryHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 19, 2011·3 cites·6 claims
- 1174US7755035B2Ion trap time-of-flight mass spectrometerHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 13, 2010·3 cites·4 claims
- 1273US11049706B2Mass spectrometer and nozzle memberHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 29, 2021·1 cites·14 claims
- 1370US10607825B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 31, 2020·1 cites·13 claims
- 1470US7544930B2Tandem type mass analysis system and methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 9, 2009·2 cites·20 claims
- 1570US7126113B2Mass spectrometry systemHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 24, 2006·2 cites·21 claims
- 1667US7999222B2Time-of-flight mass spectrometerHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 16, 2011·1 cites·7 claims
- 1763US8633841B2Signal processing device, mass spectrometer, and photometerOONISHI FUJIO·Filed 2010·Granted Jan 21, 2014·2 cites·10 claims
- 1856US8129674B2Mass spectrometric analyzerOGATA IZUMI·Filed 2008·Granted Mar 6, 2012·1 cites·7 claims
- 1956US6765200B2Mass spectrometry and mass spetrometer using the sameHITACHI LTD·Filed 2001·Granted Jul 20, 2004·3 cites·10 claims
- 2055US9418825B2Method and device for mass spectrometryHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 16, 2016·0 cites·9 claims
- 2153US7890074B2Data acquisition systemHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 15, 2011·0 cites·10 claims
- 2253US2023420238A1Ion source and mass spectrometer including the sameHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2353US2009179148A1Mass spectrometer and mass spectrometry methodHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 2451USD522391STime of flight mass spectrometerHITACHI HIGH TECH CORP·Filed 2004·Granted Jun 6, 2006·8 cites·1 claims
- 2548US9523663B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 20, 2016·0 cites·8 claims
- 2647US9921195B2Liquid chromatography-mass spectrometry deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 20, 2018·0 cites·19 claims
- 2746US10332736B2Mass spectrometer with ion frequency selectionHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 25, 2019·0 cites·17 claims
- 2846US2024272126A1Sample liquid atomization device and analysis deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2945US5786887AAtomic absorption spectrophotometer and atomic absorption spectrochemical analysisHITACHI LTD·Filed 1996·Granted Jul 28, 1998·13 cites·6 claims
- 3045US2025104987A1Mass spectrometry device and rf tuning method of mass spectrometry deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 3144US10453663B2Mass spectrometry device and ion detection method thereforHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 22, 2019·0 cites·15 claims
- 3244US10068756B2Mass spectrometerHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 4, 2018·0 cites·8 claims
- 3344US6020958AAtomic absorption spectrophotometerHITACHI LTD·Filed 1999·Granted Feb 1, 2000·10 cites·13 claims
- 3443US10229821B2Mass spectrometry deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 12, 2019·0 cites·12 claims
- 3543US2011192970A1Method and apparatus for mass spectrometryOONISHI FUJIO·Filed 2011·Application pending·0 cites
- 3640US5822059AAtomic absorption spectrophotometer and graphite tube type cuvette used for the sameHITACHI LTD·Filed 1996·Granted Oct 13, 1998·8 cites·36 claims
- 3731US5978082AAtomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorotiometerHITACHI LTD·Filed 1998·Granted Nov 2, 1999·3 cites·7 claims
- 3829US5801827AAnalysis device using chemical combustion flameHITACHI LTD·Filed 1997·Granted Sep 1, 1998·2 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →