Inventor · disambiguated record
Yen-Liang Chen
Also filed as: CHEN YEN-LIANG
57 granted patents·31 pending applications·256 citations·filing 1994–2025
98Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD29INNOLUX CORP15MEDIATEK INC12CHEN YEN-LIANG6WANG SHYH-YUEH3
Top patents by PatentIndex Score
88 records- 0198US10990023B1Method and apparatus for diffraction-based overlay measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 27, 2021·22 cites·20 claims
- 0297US11791141B2System and method for residual gas analysisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Oct 17, 2023·3 cites·19 claims
- 0396US11243475B2Overlay measurement structures with variable width/pitch for measuring overlay errorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 8, 2022·3 cites·20 claims
- 0496US8837810B2System and method for alignment in semiconductor device fabricationCHEN YEN-LIANG·Filed 2012·Granted Sep 16, 2014·82 cites·20 claims
- 0594US11275314B2Method and apparatus for diffraction-based overlay measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 15, 2022·2 cites·20 claims
- 0693US12062166B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 13, 2024·1 cites·20 claims
- 0793US10983005B2Spectroscopic overlay metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 20, 2021·6 cites·19 claims
- 0892US11841622B2Method and apparatus for diffraction-based overlay measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 12, 2023·1 cites·20 claims
- 0992US11073726B2Display device having reduced size and improved illuminationINNOLUX CORP·Filed 2019·Granted Jul 27, 2021·4 cites·20 claims
- 1090US2025370325A1Euv lithography masks and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1189US10935578B1Electronic apparatus, voltage detector and voltage detection method thereofLITE ON ELECTRONICS GUANGZHOU·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 1289US2025308868A1System and method for residual gas analysisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1389US2025079142A1System and method for residual gas analysisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1486US11119416B2Method for forming semiconductor structure and overlay error estimationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Sep 14, 2021·4 cites·20 claims
- 1585US12354857B2System and method for residual gas analysisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 8, 2025·0 cites·20 claims
- 1685US12176193B2System and method for residual gas analysisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 24, 2024·0 cites·20 claims
- 1785US10110325B2RF testing systemMEDIATEK INC·Filed 2015·Granted Oct 23, 2018·5 cites·24 claims
- 1885US2024069449A1Method and apparatus for diffraction-based overlay measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1984US12047222B2AI-assisted communication circuit optimizationMEDIATEK INC·Filed 2022·Granted Jul 23, 2024·1 cites·20 claims
- 2083US8140184B2Tank-locking device, system for managing liquid supply and method using the sameCHEN YEN-LIANG·Filed 2008·Granted Mar 20, 2012·13 cites·12 claims
- 2182US12265301B2Electronic device with backlight moduleINNOLUX CORP·Filed 2023·Granted Apr 1, 2025·0 cites·10 claims
- 2282US8539800B2Tank-locking device, system for managing liquid supply and method using the sameCHEN YEN-LIANG·Filed 2012·Granted Sep 24, 2013·7 cites·8 claims
- 2382US5435269AMulti-function apparatus for caring for petsFiled 1994·Granted Jul 25, 1995·39 cites·9 claims
- 2482US2025355376A1Method and structure for overlay measurement in semiconductor device manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2581US2025093762A1Euv lithography masks and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2680US9766554B2Method and apparatus for estimating focus and dose of an exposure processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Sep 19, 2017·2 cites·20 claims
- 2779US10795268B2Method and apparatus for measuring overlay errors using overlay measurement patternsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Oct 6, 2020·2 cites·20 claims
- 2879US9755669B2Variation calibration for envelope tracking on chipMEDIATEK INC·Filed 2016·Granted Sep 5, 2017·4 cites·20 claims
- 2978US11163102B2Backlight module and light guide plate thereof and display device using the sameINNOLUX CORP·Filed 2019·Granted Nov 2, 2021·3 cites·19 claims
- 3077US11835820B2Display device with backlight moduleINNOLUX CORP·Filed 2022·Granted Dec 5, 2023·0 cites·10 claims
- 3177US8311669B2Tank-locking device, system for managing liquid supply and method using the sameCHEN YEN-LIANG·Filed 2012·Granted Nov 13, 2012·4 cites·6 claims
- 3276US10429569B2Display deviceINNOLUX CORP·Filed 2018·Granted Oct 1, 2019·2 cites·20 claims
- 3375US9658383B2Display deviceINNOLUX CORP·Filed 2015·Granted May 23, 2017·2 cites·11 claims
- 3473US11487157B2Display deviceINNOLUX CORP·Filed 2021·Granted Nov 1, 2022·0 cites·10 claims
- 3573US8730432B2Optical film and method for manufacturing the same and liquid crystal display device using the sameWANG TZU-CHANG·Filed 2012·Granted May 20, 2014·4 cites·13 claims
- 3673US8278282B2Nucleoside analogs for treatment of viral infectionsYIN ZHENG·Filed 2008·Granted Oct 2, 2012·7 cites·8 claims
- 3772US2025249548A1Chemical mechanical polishing apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 3871US12461456B2Method and structure for overlay measurement in semiconductor device manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Nov 4, 2025·0 cites·20 claims
- 3970US11449984B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 20, 2022·0 cites·20 claims
- 4070US8842237B2Liquid crystal display deviceINNOLUX CORP·Filed 2013·Granted Sep 23, 2014·2 cites·18 claims
- 4168US12450205B1Tuner codeword database construction method and mobile deviceMEDIATEK INC·Filed 2024·Granted Oct 21, 2025·0 cites·4 claims
- 4268US8557006B2Chemical mechanical polishing slurry, its preparation method and use for the sameHOU HUI-FANG·Filed 2012·Granted Oct 15, 2013·2 cites·5 claims
- 4368US2022155696A1Overlay measurement structures and method of overlay errorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 4465US11656391B2Aperture design and methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 23, 2023·0 cites·20 claims
- 4565US8275060B2Codebook searching apparatus and method thereofCHEN CHENG-MING·Filed 2009·Granted Sep 25, 2012·3 cites·20 claims
- 4665US2025036021A1Extreme ultraviolet lithography method and euv photomaskTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 4763US9212310B2Dual-frequency bistable liquid crystal display and the liquid crystal mixture thereofWANG SHYH-YUEH·Filed 2013·Granted Dec 15, 2015·1 cites·17 claims
- 4862US12489662B2Transmitter and method for dynamically setting current mode of transmitterMEDIATEK INC·Filed 2024·Granted Dec 2, 2025·0 cites·21 claims
- 4961US12296428B2Chemical mechanical polishing apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 13, 2025·0 cites·20 claims
- 5061US10755405B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 25, 2020·0 cites·20 claims
Showing the top 50 of 88 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →