Inventor · disambiguated record
Yen Chuang
Also filed as: CHUANG YEN · CHUANG YEN-PENG
8 granted patents·6 pending applications·10 citations·filing 2008–2025
80Inventor score
Top patents by PatentIndex Score
14 records- 0190US11961884B2Fill structures with air gapsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 16, 2024·2 cites·20 claims
- 0283US10319857B2Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jun 11, 2019·3 cites·20 claims
- 0379US12324199B2Fill structures with air gapsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jun 3, 2025·0 cites·20 claims
- 0477US9812570B2Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Nov 7, 2017·2 cites·20 claims
- 0575US2025275194A1Fill Structures With Air GapsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0668US11411108B2Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 9, 2022·0 cites·20 claims
- 0762US9721827B2Semiconductor arrangement with stress control and method of makingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 1, 2017·2 cites·20 claims
- 0861US10818790B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 27, 2020·0 cites·20 claims
- 0957US10020695B2Motor stator device with simple coil-winding structureABLE ENTPR CO LTD·Filed 2015·Granted Jul 10, 2018·1 cites·7 claims
- 1052US2024162079A1Multi-function etching sacrificial layers to protect three-dimensional dummy fins in semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1150US2025056840A1Semiconductor device and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1241US2008265694A1Manufacturing process for a motor stator assembly and structure thereofCHUANG YEN-PENG·Filed 2008·Application pending·0 cites
- 1338US2015293169A1Method, systems, and devices for inspecting semiconductor devicesMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 1432US2014253137A1Test pattern design for semiconductor devices and method of utilizing thereofMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →