Inventor · disambiguated record
Yeh-Hsun Fang
Also filed as: FANG YEH · FANG YEH-HSUN
14 granted patents·7 pending applications·30 citations·filing 2018–2025
89Inventor score
Top patents by PatentIndex Score
21 records- 0196US12057467B2Image sensor device and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 6, 2024·2 cites·18 claims
- 0296US11894411B2Image sensor device and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Feb 6, 2024·2 cites·20 claims
- 0391US11515355B2Image sensor device and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 29, 2022·2 cites·20 claims
- 0490US10445221B2Automated application testing systemSAUCE LABS INC·Filed 2018·Granted Oct 15, 2019·11 cites·22 claims
- 0590US2025344525A1Image sensor device and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0689US12364028B2Image sensor device and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jul 15, 2025·0 cites·20 claims
- 0789US11416377B2Automated application testing systemSAUCE LABS INC·Filed 2019·Granted Aug 16, 2022·7 cites·15 claims
- 0883US10515861B2Method for calibrating temperature in chemical vapor depositionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 24, 2019·3 cites·20 claims
- 0983US2025318294A1Germanium-based photodetector with reduced dark current and methods of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1082US2024405035A1Germanium-based photodetector with reduced dark current and methods of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1181US11626442B2Methods for forming image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 11, 2023·1 cites·20 claims
- 1281US10818563B2Method for calibrating temperature in chemical vapor depositionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 27, 2020·2 cites·20 claims
- 1377US2025355096A1Method for making an image sensor for time-of-flight systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1476US12369420B2Methods for forming image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 22, 2025·0 cites·20 claims
- 1576US2023378218A1Methods for forming image sensorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1673US2025081642A1Photodetector with reduced dark current sensitivity and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1771US12364036B2Germanium-based photodetector with reduced dark currentTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 15, 2025·0 cites·20 claims
- 1870US12086051B2Automated application testing systemSAUCE LABS INC·Filed 2022·Granted Sep 10, 2024·0 cites·20 claims
- 1968US11610825B2Method for calibrating temperature in chemical vapor depositionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 21, 2023·0 cites·20 claims
- 2065US12191328B2Photodetector with reduced dark current sensitivity and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jan 7, 2025·0 cites·20 claims
- 2159US2023065710A1Image sensor for time-of-flight system and methods of making the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →