Inventor · disambiguated record
Yeeun Han
Also filed as: HAN YEEUN
0 granted patents·2 pending applications·0 citations·filing 2023–2023
Technology areasH10P
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0151US2024133683A1Overlay measuring method and system, and method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0248US2023411393A1Overlay measuring method and semiconductor device fabricated using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →