Inventor · disambiguated record
Ye Huo
Also filed as: HUO YE
4 granted patents·4 pending applications·0 citations·filing 2020–2024
50Inventor score
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8 records- 0154US2023051442A1Method for Calibrating Crosstalk Errors in System for Measuring on-Wafer S Parameters and Electronic DeviceTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2022·Application pending·0 cites
- 0251US11385175B2Calibration method and terminal equipment of terahertz frequency band on-wafer S parameterTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2020·Granted Jul 12, 2022·0 cites·13 claims
- 0350US2025284507A1Generating instructions for user interface changes based on version updatesIBM·Filed 2024·Application pending·0 cites
- 0447US11733298B2Two-port on-wafer calibration piece circuit model and method for determining parametersTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2021·Granted Aug 22, 2023·0 cites·2 claims
- 0545US11971451B2Method for determining parameters in on-wafer calibration piece modelTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2021·Granted Apr 30, 2024·0 cites·15 claims
- 0642US2025124828A1Dynamic display output adjustment based on user's line of sightIBM·Filed 2023·Application pending·0 cites
- 0737US11275103B2Calibration method, system and device of on-wafer s parameter of vector network analyzerTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2020·Granted Mar 15, 2022·0 cites·13 claims
- 0832US2021281530A1Instant message deliveryIBM·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →