Inventor · disambiguated record
Yeng-Kaung Peng
Also filed as: PENG YENG-KAUNG
6 granted patents·496 citations·filing 1995–1998
88Inventor score
Files withADVANCED MICRO DEVICES INC6
Top patents by PatentIndex Score
6 records- 0194US5787190AMethod and apparatus for pattern recognition of wafer test binsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 28, 1998·230 cites·3 claims
- 0283US5598341AReal-time in-line defect disposition and yield forecasting systemADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 28, 1997·82 cites·17 claims
- 0381US6028994AMethod for predicting performance of microelectronic device based on electrical parameter test data using computer modelADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 22, 2000·67 cites·24 claims
- 0473US5561293AMethod of failure analysis with CAD layout navigation and FIB/SEM inspectionADVANCED MICRO DEVICES INC·Filed 1995·Granted Oct 1, 1996·50 cites·19 claims
- 0570US5822717AMethod and apparatus for automated wafer level testing and reliability data analysisADVANCED MICRO DEVICES INC·Filed 1995·Granted Oct 13, 1998·34 cites·10 claims
- 0666US5886909ADefect diagnosis using simulation for IC yield improvementADVANCED MICRO DEVICES INC·Filed 1997·Granted Mar 23, 1999·33 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →