Inventor · disambiguated record
Yeh-Chin Wang
Also filed as: WANG YEH-CHIN
3 granted patents·1 pending application·6 citations·filing 2021–2024
62Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD4
Top patents by PatentIndex Score
4 records- 0197US11487210B1Method and system of surface topography measurement for lithographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 1, 2022·4 cites·20 claims
- 0296US11835866B2Method and system of surface topography measurement for lithographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 5, 2023·2 cites·20 claims
- 0387US12189306B2Method and system of surface topography measurement for lithographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 0487US2025093787A1Method and system of surface topography measurement for lithographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →