Inventor · disambiguated record
Yeh-Jye Wann
Also filed as: WANN YEH-JYE
10 granted patents·158 citations·filing 1995–2005
90Inventor score
Top patents by PatentIndex Score
10 records- 0174US5879577AProcess for wafer peripheral edge defect reductionTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Mar 9, 1999·46 cites·13 claims
- 0271US7109090B1Pyramid-shaped capacitor structureTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Sep 19, 2006·4 cites·12 claims
- 0359US5753548AMethod for preventing fluorine outgassing-induced interlevel dielectric delamination on P-channel FETSTAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted May 19, 1998·21 cites·20 claims
- 0453US6087699ALaminated gate mask ROM deviceTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Jul 11, 2000·14 cites·21 claims
- 0553US5707896AMethod for preventing delamination of interlevel dielectric layer over FET P+ doped polysilicon gate electrodes on semiconductor integrated circuitsTAIWAN SEMICONDUCTOR MANUACTUR·Filed 1996·Granted Jan 13, 1998·17 cites·18 claims
- 0650US5811343AOxidation method for removing fluorine gas inside polysilicon during semiconductor manufacturing to prevent delamination of subsequent layer induced by fluorine outgassing dielectricTAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted Sep 22, 1998·14 cites·3 claims
- 0750US5514610AMethod of making an optimized code ion implantation procedure for read only memory devicesTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted May 7, 1996·15 cites·18 claims
- 0844US5589414AMethod of making mask ROM with two layer gate electrodeTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Dec 31, 1996·9 cites·21 claims
- 0942US5745239AMultiple focal plane image comparison for defect detection and classificationTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Apr 28, 1998·10 cites·19 claims
- 1039US6032704AMethod and apparatus for storing wafers without moisture absorptionTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Mar 7, 2000·8 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →