Inventor · disambiguated record
Yeak-Chong Wong
Also filed as: WONG YEAK-CHONG
8 granted patents·30 citations·filing 2004–2012
82Inventor score
Top patents by PatentIndex Score
8 records- 0173US7809459B2Advanced-process-control system utilizing a lambda tunerHITACHI GLOBAL STORAGE TECH NL·Filed 2007·Granted Oct 5, 2010·8 cites·16 claims
- 0272US7269526B2Aggregated run-to-run process control for wafer yield optimizationHITACHI GLOBAL STORAGE TECH·Filed 2005·Granted Sep 11, 2007·7 cites·10 claims
- 0371US7914657B2Controlling the thickness of wafers during the electroplating processHITACHI GLOBAL STORAGE TECH NL·Filed 2005·Granted Mar 29, 2011·2 cites·21 claims
- 0469US7722436B2Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge modelHITACHI GLOBAL STORAGE TECH·Filed 2007·Granted May 25, 2010·3 cites·12 claims
- 0567US7264535B2Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge modelHITACHI GLOBAL STORAGE TECH·Filed 2004·Granted Sep 4, 2007·10 cites·21 claims
- 0647US9110465B1Methods for providing asymmetric run to run control of process parametersFENG JIAN-HUEI·Filed 2011·Granted Aug 18, 2015·0 cites·14 claims
- 0743US9213322B1Methods for providing run to run process control using a dynamic tunerFENG JIAN-HUEI·Filed 2012·Granted Dec 15, 2015·0 cites·14 claims
- 0835US7254884B2Method for fabricating a pole tip in a magnetic transducer using feed-forward and feedbackHITACHI GLOBAL STORAGE TECH·Filed 2004·Granted Aug 14, 2007·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →