Inventor · disambiguated record
Yih-Chau Chen
Also filed as: CHEN YIH-CHAU
2 granted patents·4 citations·filing 2002–2020
41Inventor score
Technology areasG01R
Files withWINBOND ELECTRONICS CORP2
Top patents by PatentIndex Score
2 records- 0144US11821919B2Short-circuit probe card, wafer test system, and fault detection method for the wafer test systemWINBOND ELECTRONICS CORP·Filed 2020·Granted Nov 21, 2023·0 cites·8 claims
- 0237US6949941B2Manual tester for testing device and method thereofWINBOND ELECTRONICS CORP·Filed 2002·Granted Sep 27, 2005·4 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →