Inventor · disambiguated record
Ying-Chou Cheng
Also filed as: CHENG YING-CHOU
25 granted patents·3 pending applications·256 citations·filing 2000–2019
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG8TAIWAN SEMICONDUCTOR MFG CO LTD8CHENG YING CHOU6LIU GEORGE2LOGITECH EUROP SA2
Top patents by PatentIndex Score
28 records- 0196US9404743B2Method for validating measurement dataTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Aug 2, 2016·62 cites·20 claims
- 0292US9367655B2Topography-aware lithography pattern checkSHIH I-CHANG·Filed 2012·Granted Jun 14, 2016·69 cites·20 claims
- 0390US8431291B2Intensity selective exposure photomaskLIU GEORGE·Filed 2011·Granted Apr 30, 2013·5 cites·16 claims
- 0490US8372742B2Method, system, and apparatus for adjusting local and global pattern density of an integrated circuit designTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 12, 2013·14 cites·18 claims
- 0589US7783999B2Electrical parameter extraction for integrated circuit designTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Aug 24, 2010·23 cites·16 claims
- 0688US8001494B2Table-based DFM for accurate post-layout analysisTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Aug 16, 2011·16 cites·20 claims
- 0787US8527918B2Target-based thermal design using dummy insertion for semiconductor devicesCHENG YING-CHOU·Filed 2011·Granted Sep 3, 2013·11 cites·20 claims
- 0887US8037575B2Method for shape and timing equivalent dimension extractionTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Oct 18, 2011·17 cites·18 claims
- 0983US8952329B13D image profiling techniques for lithographyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Feb 10, 2015·6 cites·19 claims
- 1083US8332797B2Parameterized dummy cell insertion for process enhancementCHENG YING-CHOU·Filed 2010·Granted Dec 11, 2012·8 cites·18 claims
- 1179US8910092B1Model based simulation method with fast bias contour for lithography process checkTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Dec 9, 2014·6 cites·18 claims
- 1278US8219951B2Method of thermal density optimization for device and process enhancementCHENG YING-CHOU·Filed 2010·Granted Jul 10, 2012·5 cites·20 claims
- 1376US8745554B2Practical approach to layout migrationCHENG YING-CHOU·Filed 2009·Granted Jun 3, 2014·8 cites·20 claims
- 1472US9026957B2Method of defining an intensity selective exposure photomaskTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted May 5, 2015·1 cites·15 claims
- 1570US8673520B2Intensity selective exposure photomaskLIU GEORGE·Filed 2011·Granted Mar 18, 2014·1 cites·19 claims
- 1665US11353324B2Method for validating measurement dataTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 7, 2022·0 cites·20 claims
- 1765US9612526B2Photomask and method for fabricating integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Apr 4, 2017·1 cites·20 claims
- 1863US10520303B2Method for validating measurement dataTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 31, 2019·0 cites·20 claims
- 1963US9189587B2Chip level critical point analysis with manufacturer specific dataTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 17, 2015·1 cites·20 claims
- 2063US8201111B2Table-based DFM for accurate post-layout analysisHOU YUNG-CHIN·Filed 2011·Granted Jun 12, 2012·1 cites·20 claims
- 2159US9823066B2Method for validating measurement dataTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Nov 21, 2017·0 cites·20 claims
- 2257US9983473B2Photomask and method for fabricating integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 29, 2018·0 cites·20 claims
- 2351US8806386B2Customized patterning modulation and optimizationCHENG YING-CHOU·Filed 2009·Granted Aug 12, 2014·0 cites·22 claims
- 2450US6486463B1Computer input device with encoders having flexible shafts and conical rollersLOGITECH EUROP SA·Filed 2000·Granted Nov 26, 2002·1 cites·14 claims
- 2548US9159577B2Method of forming substrate patternTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Oct 13, 2015·0 cites·20 claims
- 2644US2007232402A1Precision friction clutch moduleLOGITECH EUROP SA·Filed 2006·Application pending·0 cites
- 2743US2010295430A1Tool organizing deviceCHENG YING CHOU·Filed 2010·Application pending·0 cites
- 2839US2014226893A1Method and System for Image-Based Defect AlignmentTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →