Inventor · disambiguated record
Yij Chieh Chu
Also filed as: CHU YIJ-CHIEH
6 granted patents·8 pending applications·7 citations·filing 2008–2011
71Inventor score
Top patents by PatentIndex Score
14 records- 0169US8756028B2Fault detection method of semiconductor manufacturing processes and system architecture thereofCHU YIJ CHIEH·Filed 2011·Granted Jun 17, 2014·3 cites·9 claims
- 0265US8649990B2Method for detecting variance in semiconductor processesCHU YIJ CHIEH·Filed 2011·Granted Feb 11, 2014·2 cites·20 claims
- 0350US8244500B2Method of adjusting wafer processing sequenceTIAN YUN-ZONG·Filed 2009·Granted Aug 14, 2012·2 cites·12 claims
- 0449US2010223027A1Monitoring method for multi toolsINOTERA MEMORIES INC·Filed 2009·Application pending·0 cites
- 0546US2010004882A1Fault detection and classification method for wafer acceptance test parametersINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 0645US2010093114A1Method of searching for key semiconductor operation with randomization for wafer positionINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 0745US2010049355A1Method for determining tool's production qualityINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 0844US8510610B2Method and system of compressing raw fabrication data for fault determinationCHU YIJ CHIEH·Filed 2011·Granted Aug 13, 2013·0 cites·10 claims
- 0944US8265903B2Method for assessing data worth for analyzing yield rateCHU YIJ CHIEH·Filed 2009·Granted Sep 11, 2012·0 cites·7 claims
- 1044US2010010763A1Method for detecting variance in semiconductor processesINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 1140US2011251708A1Method for planning production schedule of equipment and associated computer readable mediumCHEN WEI-JUN·Filed 2010·Application pending·0 cites
- 1236US2011153660A1Method of searching for key semiconductor operation with randomization for wafer positionINOTERA MEMORIES INC·Filed 2011·Application pending·0 cites
- 1335US2011137595A1Yield loss prediction method and associated computer readable mediumCHU YIJ-CHIEH·Filed 2010·Application pending·0 cites
- 1431US8332416B2Specification establishing method for controlling semiconductor processCHEN CHENG-HAO·Filed 2011·Granted Dec 11, 2012·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →