Inventor · disambiguated record
Yixiang Duan
Also filed as: DUAN YIXIANG
8 granted patents·4 pending applications·115 citations·filing 2000–2008
88Inventor score
Files withUNIV CALIFORNIA5LOS ALAMOS NAT SECURITY LLC2UNIV MISSISSIPPI1UNIVERSTIY OF CALIFORNIA1US OF AMERICA DEPT OF ENERGY1
Top patents by PatentIndex Score
12 records- 0183US6429935B1Microwave plasma monitoring system for real-time elemental analysisUNIV CALIFORNIA·Filed 2000·Granted Aug 6, 2002·27 cites·10 claims
- 0279US6406669B1Polyaniline-based optical ammonia detectorUNIV CALIFORNIA·Filed 2001·Granted Jun 18, 2002·21 cites·6 claims
- 0378US7263246B1Oxygen detection using evanescent fieldsUS OF AMERICA DEPT OF ENERGY·Filed 2006·Granted Aug 28, 2007·12 cites·20 claims
- 0477US7417730B2Apparatus and method for monitoring breath acetone and diabetic diagnosticsLOS ALAMOS NAT SECURITY LLC·Filed 2006·Granted Aug 26, 2008·16 cites·6 claims
- 0577US6734964B1Pulsed, atmospheric pressure plasma source for emission spectrometryUNIV CALIFORNIA·Filed 2001·Granted May 11, 2004·15 cites·50 claims
- 0674US6900734B2Capillary-discharge based detector for chemical vapor monitoringUNIVERSTIY OF CALIFORNIA·Filed 2003·Granted May 31, 2005·13 cites·41 claims
- 0767US7054008B2Method and apparatus for elemental and isotope measurements and diagnostics-microwave induced plasma-cavity ring-down spectroscopyUNIV MISSISSIPPI·Filed 2003·Granted May 30, 2006·9 cites·17 claims
- 0866US7839499B2Hydrogen sensorLOS ALAMOS NAT SECURITY LLC·Filed 2008·Granted Nov 23, 2010·2 cites·10 claims
- 0949US2007113867A1Polymer treatment using a plasma brushUNIV CALIFORNIA·Filed 2006·Application pending·0 cites
- 1044US2005112557A1Mesoporous-chip based biosensor for rapid biological agent detectionFiled 2004·Application pending·0 cites
- 1140US2007116891A1Plasma brush apparatus and methodUNIV CALIFORNIA·Filed 2005·Application pending·0 cites
- 1236US2005008550A1Low-power atmospheric pressure mini-plasma and array for surface and material treatmentFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →